Effect of Post Annealing on the Structural Properties of Vanadium Oxide Thin Film Deposited by RF Sputtering

Gupta, Kapil; Kumar, Sarvesh

doi:10.17485/ijst/2017/v10i42/115790

Cited by 3 publications

(2 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…One of the main challenges of these sensors is long-term stability. Since the melting point of V2O5 is 680 °C [22] (650 °C in some studies [23]), there is a high possibility that an operating temperature of 600°C for a long period could cause damage of Au-V2O5 sensing electrode.…”

Section: Methodsmentioning

confidence: 99%

Development of a selective ammonia YSZ-based sensor and modeling of its response

Abkenar

Rieu

Breuil

et al. 2021

Sensors and Actuators B: Chemical

View full text Add to dashboard Cite

Section: Methodsmentioning

confidence: 99%

Development of a selective ammonia YSZ-based sensor and modeling of its response

Abkenar

Rieu

Breuil

et al. 2021

Sensors and Actuators B: Chemical

View full text Add to dashboard Cite

“…It was observed that doping with high valent cations decrease and low valent cation increase the switching temperature of electrical and optical properties of vanadium oxide thin films. Gupta and Kumar [13] deposited the thin films of vanadium oxide by RF sputtering and studied the effect of post annealing. It was found that a highly crystalline and layered structure vanadium pentoxide thin film obtained by post annealing at 500°C in Ar atmosphere.…”

Section: Introductionmentioning

confidence: 99%

Effect of Ion Irradiation on Vanadium Oxide Thin Films Deposited by Reactive RF Sputtering Technique

Gupta¹,

Kumar²,

Singhal³

2019

IJRTE

Self Cite

View full text Add to dashboard Cite

Vanadium has many oxides (VO 2 , V 2 O 3 , V 2 O 4 , V 6 O 13 and V 2 O 5 ) due to high oxidation state. Properties of the vanadium oxide thin films can be changed by pressure, doping and strain. Ion irradiation can transform the phase, mix the two solid materials, form epitaxial crystallization and create nanostructure etc. in the materials. Purpose of our study was to observe the effect of swift heavy ions (SHIs) irradiation on vanadium oxide thin films. Thin films of vanadium oxide were deposited on the Si substrate by reactive RF sputtering technique. As-deposited thin films were irradiated by swift heavy ions (100 MeV Ag ions) at different fluences at room temperature. The effect of ions irradiation was studied by using grazing incidence X-ray diffraction (GIXRD), Fourier transform infrared spectroscopy (FTIR) and UV-vis-NIR spectrophotometer characterization techniques. GIXRD pattern revealed that swift heavy ions can induce the phase transformation (V 6 O 13 to V 2 O 3 ) in the films. FTIR characterization showed that δ(V=O) stretching mode at 1020 cm -1 shifted to the lower wave number side. Optical properties showed blue shift in the absorption spectra at the higher fluences. These shifting are due to the lowering of vanadium's oxidation state in the thin films. This change in oxidation state of vanadium transforms the phase of the films. Irradiation with SHIs can transform the phase along with enhancement in the crystallinity of the vanadium oxide films.

show abstract

Wear and corrosion studies on vanadium pentoxide coated on magnesium alloy (AZ-31B) using dip coating process

Kachupalli¹,

Prasanth

Murthy

et al. 2020

3rd International Conference on Frontiers in Automobile and Mechanical Engineering (Fame 2020)

View full text Add to dashboard Cite

Effect of Post Annealing on the Structural Properties of Vanadium Oxide Thin Film Deposited by RF Sputtering

Cited by 3 publications

References 15 publications

Development of a selective ammonia YSZ-based sensor and modeling of its response

Development of a selective ammonia YSZ-based sensor and modeling of its response

Effect of Ion Irradiation on Vanadium Oxide Thin Films Deposited by Reactive RF Sputtering Technique

Wear and corrosion studies on vanadium pentoxide coated on magnesium alloy (AZ-31B) using dip coating process

Contact Info

Product

Resources

About