2011
DOI: 10.1051/metal/2011021
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Effect of scan rates and imposed potentials on the formation and growth of oxide film on Ti6Al4V alloy surface in 3% NaCl

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Cited by 6 publications
(5 citation statements)
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“…The values of impedance parameters given in table 3 indicate that the resistance values, film thickness and exponent n gradually increase with the increase in potential, whereas the capacitance decreases. The results are in good agreement with our previous work [29]…”
Section: Electrochemical Impedance Spectroscopysupporting
confidence: 93%
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“…The values of impedance parameters given in table 3 indicate that the resistance values, film thickness and exponent n gradually increase with the increase in potential, whereas the capacitance decreases. The results are in good agreement with our previous work [29]…”
Section: Electrochemical Impedance Spectroscopysupporting
confidence: 93%
“…Fig. 1 show the variation of open circuit potential of Ti6Al4V with time, the potential decreases with time until reaching a less noble value near -275 mV after 15 minutes; this behavior is different from that of Ti6Al4V in 3% NaCl solution [29], this behaviour is probably related to the pH of the medium.…”
Section: Open Circuit Potential Measurementmentioning
confidence: 91%
“…This passivation film inhibits the sample's dissolution, leading to a positive shift in the OCP value. 9 In electrochemical tests, the formation of a passivation film on the matrix material's surface impedes the rate of ion exchange between the metal surface and the electrolyte, resulting in an increase in the corresponding OCP value.…”
Section: Resultsmentioning
confidence: 99%
“…For the open circuit potential (OCP) test, samples underwent cathodic pre-polarization at −2.1 VSCE for 2 min to remove the oxide film formed on their surfaces in the air, 9 and then OCP was measured for 5 h. Electrochemical impedance spectroscopy (EIS) tests were conducted with an amplitude of 10 mV and a frequency range spanning from 100,000 Hz to 0.01 Hz. Scanning electron microscopy (SEM, Regulus 8100, Hitachi, Japan) with energy dispersive spectrometry (EDS, Oxford, Ultim max, America) and X-ray photoelectron spectroscopy (XPS, Scientific K-Alpha, Thermo, America) were employed to gather additional information about the newly formed passive film.…”
Section: Methodsmentioning
confidence: 99%
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