2009
DOI: 10.1016/j.physb.2008.12.018
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Effect of Schottky barrier on the transport property in perovskite oxide heterostructures

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Cited by 3 publications
(2 citation statements)
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“…It has been reported that contact of Au/perovskite oxide films and In/NSTO is good Ohmic. 20,21) The Au and In electrodes were used as ohmic contacts for SSO and NSTO, respectively. By applying a pulsed dc bias across the interface with the voltage polarity defined at the bottom In electrode, the temperature-dependent IV curves were measured.…”
Section: Resultsmentioning
confidence: 99%
“…It has been reported that contact of Au/perovskite oxide films and In/NSTO is good Ohmic. 20,21) The Au and In electrodes were used as ohmic contacts for SSO and NSTO, respectively. By applying a pulsed dc bias across the interface with the voltage polarity defined at the bottom In electrode, the temperature-dependent IV curves were measured.…”
Section: Resultsmentioning
confidence: 99%
“…However, it is observed that the maximum forward bias of the magnetite films deposited on 0.1% Nb:SrTiO 3 is higher than the value obtained for the samples grown on 1.4% Nb:SrTiO 3 substrates. Theoretical calculations performed recently by Han et al in perovskite oxide heterostructures [203], have attributed this behavior to the Schottky junction formed by the In contact and the Nb:SrTiO 3 substrate. This effect decreases the maximum bias voltage for higher doping densities and the experimental measurements cannot be fitted with the previous model.…”
Section: Nbmentioning
confidence: 93%