Effect of sputtering condition on dynamic characteristics and microstructures of magneto-optical 5.25 in. SiN/TbFeCo/SiN/Al disks for 532 nm recording media

Ro, Myongdo; Cho, B. I.; Kim, M. J.; Kim, S. S.; Ahn, Y. M.; Lee, K. G.; Gill, B. L.

doi:10.1063/1.362220

Journal of Applied Physics

1996

DOI: 10.1063/1.362220

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Effect of sputtering condition on dynamic characteristics and microstructures of magneto-optical 5.25 in. SiN/TbFeCo/SiN/Al disks for 532 nm recording media

Myongdo Ro

B. I. Cho

M. J. Kim

et al.

Abstract: Improvement of magnetooptical characteristics of TbFeCo/Al bilayered films at a short wavelength of 400 nm J. Appl. Phys. 70, 6395 (1991); 10.1063/1.349954Study on high reliability TbFeCoNb magnetooptical recording disk

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Effect of sputtering condition on dynamic characteristics and microstructures of magneto-optical 5.25 in. SiN/TbFeCo/SiN/Al disks for 532 nm recording media

Abstract: Improvement of magnetooptical characteristics of TbFeCo/Al bilayered films at a short wavelength of 400 nm J. Appl. Phys. 70, 6395 (1991); 10.1063/1.349954Study on high reliability TbFeCoNb magnetooptical recording disk

Cited by 0 publications

References 8 publications

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