2004
DOI: 10.1023/b:msat.0000049810.75325.f9
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Effect of Structure of Aluminum-Silicon Alloys on the Process of Formation and Characteristics of Oxide Layer in Microarc Oxidizing

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Cited by 27 publications
(14 citation statements)
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“…There is circumstantial evidence of these conclusions in the paper. 8) In this paper, data indicating that the coating thickness on the aluminum surface section was higher than that on the surface of the silicon particles were registered. Figure 8 shows the phase compositions of the coating layers for different durations of the microplasma process.…”
Section: 2mentioning
confidence: 74%
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“…There is circumstantial evidence of these conclusions in the paper. 8) In this paper, data indicating that the coating thickness on the aluminum surface section was higher than that on the surface of the silicon particles were registered. Figure 8 shows the phase compositions of the coating layers for different durations of the microplasma process.…”
Section: 2mentioning
confidence: 74%
“…8,10) An explanation for this was found in the following reference: 8) ''The hindering of the growth of the oxide layer by silicon particles in the microarc oxidation of aluminum-silicon alloys is caused by the higher electrical resistivity of silicon with respect to the aluminum matrix.'' This also means that the voltage for the microplasma process of the Al-Si alloy must be higher where the silicon content is high than where it is low.…”
Section: 2mentioning
confidence: 99%
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“…As a result during MAO interaction of Al and oxygen becomes difficult. In those parts where silicon comes out on the surface, coating is not formed or its quality is unsatisfactory -no very hard oxides are formed [11,12].…”
Section: Discussionmentioning
confidence: 99%