2021
DOI: 10.1016/j.ijleo.2021.166975
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Effect of substituting the ionic radius in the structural and optoelectrical properties of spin-coated thin film synthesized by solvothermal method

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Cited by 8 publications
(2 citation statements)
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“…1c and d that with the increase of Zn 2+ doping content, the peak positions of (010) diffraction peaks shift to the left by 0.07°, 0.09° and 0.12°, correspondingly, and the peak positions of (020) diffraction peaks shift to the left by 0.13°, 0.20° and 0.24°, respectively. This is probably because the ionic radius (0.74 Å) of Zn 2+ 28,29 is larger than the ionic radius (0.60 Å) of W 6+ , 30 resulting in lattice expansion and increased interplanar spacing. The (010) interplanar spacing was increased by 0.002 nm, calculated by Bragg eqn (2):where D is the grain size, K is the Scherrer constant, B is the half-peak width of the diffraction peak, θ is the diffraction angle, and the X-ray wavelength (Cu-Kα radiation source) is 0.154056 nm.2 d sin θ = λ where d is the crystal plane spacing, θ is the angle between the incident ray, the reflection ray and the reflection crystal plane, λ is the incident X-ray wavelength, and the copper target Cu-Kα is used as the radiation source ( λ = 0.154178 nm).…”
Section: Resultsmentioning
confidence: 99%
“…1c and d that with the increase of Zn 2+ doping content, the peak positions of (010) diffraction peaks shift to the left by 0.07°, 0.09° and 0.12°, correspondingly, and the peak positions of (020) diffraction peaks shift to the left by 0.13°, 0.20° and 0.24°, respectively. This is probably because the ionic radius (0.74 Å) of Zn 2+ 28,29 is larger than the ionic radius (0.60 Å) of W 6+ , 30 resulting in lattice expansion and increased interplanar spacing. The (010) interplanar spacing was increased by 0.002 nm, calculated by Bragg eqn (2):where D is the grain size, K is the Scherrer constant, B is the half-peak width of the diffraction peak, θ is the diffraction angle, and the X-ray wavelength (Cu-Kα radiation source) is 0.154056 nm.2 d sin θ = λ where d is the crystal plane spacing, θ is the angle between the incident ray, the reflection ray and the reflection crystal plane, λ is the incident X-ray wavelength, and the copper target Cu-Kα is used as the radiation source ( λ = 0.154178 nm).…”
Section: Resultsmentioning
confidence: 99%
“…As the growth temperature increases from set A to set B, the O-H As seen, the crystallite size decreases as Ru doping increases in both sets; this result is due to the large molecular weight of the dopant (Ru) compared to the host (Zn) atoms, initiating an increase in the grain boundaries, resulting in the decrease in the crystallite size [35]. The impurity phase of RuO 2 shows a remarkable rise as Ru doping increases, caused by the large ionic difference between the dopant Ru 3+ (0.068 nm) and the host Zn 2+ (0.0074 nm) [36,37]. This large ionic difference prevents the dopant from incorporating into the host atoms leading to an increase in the crystallite size, as depicted in Table 1 [38].…”
Section: Resultsmentioning
confidence: 99%