2010
DOI: 10.12693/aphyspola.118.623
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Effect of Substrate Temperature on the Structural and Optical Properties of Nanocrystalline Cadmium Selenide Thin Films Prepared by Electron Beam Evaporation Technique

Abstract: Cadmium selenide (CdSe) thin films on glass substrates were prepared by physical vapour deposition under vacuum using the electron beam evaporated technique for different substrate temperatures: room temperature, 100, 200, 300• C, respectively. X-ray diffraction analysis indicates that the films are polycrystalline, having hexagonal (wurtzite) structure irrespective of their substrate temperature. All the films show most preferred orientation along (0 0 2) plane parallel to the substrates. The microstructural … Show more

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Cited by 21 publications
(5 citation statements)
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“…A similar result was reported by Mathuri et al up to a substrate temperature of 150 °C through the electron beam evaporation route [42]. The predominant (002) peak was also observed in the electron beam deposited CdSe thin films by Kissinger et al [43] and Murali et al [44].…”
Section: X-ray Diffraction Analysissupporting
confidence: 80%
See 1 more Smart Citation
“…A similar result was reported by Mathuri et al up to a substrate temperature of 150 °C through the electron beam evaporation route [42]. The predominant (002) peak was also observed in the electron beam deposited CdSe thin films by Kissinger et al [43] and Murali et al [44].…”
Section: X-ray Diffraction Analysissupporting
confidence: 80%
“…In this study, the substrate temperature was varied from a temperature of 30 to 250 °C to explore its properties for enhanced photo-detection. The photo-detecting properties of the prepared films in our current work were found to be better than most of the existing literature [36][37][38].…”
Section: Introductioncontrasting
confidence: 45%
“…The values of the strain of CdS and CdS:Sn thin films are given in Table 2. It is clear from this table that the strain in CdS and CdS:Sn thin films increases with increasing in Sn concentration which can be also deduced from the decreasing in the grain size , where the increasing in the strain and the dislocation density with the decreasing in the grain size is a well-known phenomenon [19].…”
Section: Results and Discussion 1 Structural Propertiesmentioning
confidence: 70%
“…where D is the grain size. The lattice constant for the hexagonal phase of MgSe:Eu was estimated from the relation given by [21][22]:…”
Section: Structural Characterization Of Mgse:eu Films X-ray Diffractimentioning
confidence: 99%