2010
DOI: 10.1016/j.jallcom.2010.01.098
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Effect of temperature, illumination and frequency on the electrical characteristics of Cu/p-Si Schottky diode prepared by liquid phase epitaxy

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Cited by 54 publications
(29 citation statements)
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“…In general, there is a discrepancy between the BHs obtained from reverse bias C-V measurements and forward bias I-V measurements, i.e., the value of˚C V is significantly higher than˚I V . This discrepancy could be explained in terms of the existence of excess capacitance of devices due to N ss or dislocations at M/S interface and barrier height (BH) inhomogeneties [21][22][23][24][25][26][27][28]. It is well known that the electrical characterization only at room temperature or narrow temperature range of the semiconductor devices, such as metal-semiconductor (MS) or metal-insulator-semiconductor (MIS) type Schottky barrier diodes (SBDs), solar cells (SCs) and laser diodes (LDs), cannot give detailed information about their conduction mechanisms or the nature of barrier formation at M/S interface.…”
Section: Introductionmentioning
confidence: 99%
“…In general, there is a discrepancy between the BHs obtained from reverse bias C-V measurements and forward bias I-V measurements, i.e., the value of˚C V is significantly higher than˚I V . This discrepancy could be explained in terms of the existence of excess capacitance of devices due to N ss or dislocations at M/S interface and barrier height (BH) inhomogeneties [21][22][23][24][25][26][27][28]. It is well known that the electrical characterization only at room temperature or narrow temperature range of the semiconductor devices, such as metal-semiconductor (MS) or metal-insulator-semiconductor (MIS) type Schottky barrier diodes (SBDs), solar cells (SCs) and laser diodes (LDs), cannot give detailed information about their conduction mechanisms or the nature of barrier formation at M/S interface.…”
Section: Introductionmentioning
confidence: 99%
“…There are many methods of determining the SBH based on I-V, C-V and photoelectric measurements in the literature [15][16][17][18][19][20][21][22][23][24][25][26][27][28][29]. Detailed knowledge of the current-transport process involved is essential in order to extract the barrier parameters, namely, BH, n and R s .…”
Section: Introductionmentioning
confidence: 99%
“…Under an external and a native electric field due to electron-hole diffusion at M/S interface, the holes swept to the back contact while electrons gathered at the junction. Also, it has been well known that there are currently many reports on experimental studies of metal-semiconductor (MS) and metal-insulator-semiconductor (MIS) Schottky barrier diodes (SBDs) [10][11][12][13][14][15][16][17]. Consequently, there would be an additional photocurrent over the usual dark diode current [18][19][20].…”
Section: Introductionmentioning
confidence: 99%