Effect of the method of measurement of ADC and DAC linearity on the yield of acceptable microcircuits

Vonyatytskii, A. Yu.

doi:10.1007/bf00979300

Meas Tech

1991

DOI: 10.1007/bf00979300

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Effect of the method of measurement of ADC and DAC linearity on the yield of acceptable microcircuits

A. Yu. Vonyatytskii¹

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Effect of the method of measurement of ADC and DAC linearity on the yield of acceptable microcircuits

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References 15 publications

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