Effect of the source solution quantity on optical characteristics of ZnO and NiO thin films grown by spray pyrolysis for the design NiO/ZnO photodetectors

Towards Understanding Excited-State Properties of Organic Molecules Using Time-Resolved Soft X-ray Absorption Spectroscopy

“…The thickness we monitored with a quartz crystal and the stoichiometry with EDX measurements delivered an O:Ni ratio of about 51:48 (see Figures S1 and S2). Figure 9 shows the UV/Vis spectrum of a 300 nm thick NiO sample with the bandgap energy of NiO at 3.6 eV [59]. This value is very close to the photon energy of the third harmonic of the pump laser.…”

Physical Operations of a Self-Powered IZTO/β-Ga2O3 Schottky Barrier Diode Photodetector

“…It reflects the crystallinity and optical quality of thin films. The extinction coefficient ( ) and the refractive index ( ) of IZTO thin film are calculated by [ 29 ]: where is the reflectance of the thin film, which can be calculated by the following equation [ 30 ]: where is the IZTO thin film thickness, which is evaluated by ellipsometry at 300 nm. The extracted refractive index ( ) and the extinction coefficient ( ) are presented in Figure 3 .…”

Design of Efficient Inverted NiOX‐Based Three‐Terminal Back‐Contact All Perovskite Tandem Solar Cells

“…[20][21][22][23] The refractive index and absorption coefficient values of materials, for instance, TiO 2 , Ni, Cu, CuO, and Ag) were extracted from the Silvaco database; and the refractive index and absorption coefficient data of other materials, including NiO X , SnO 2 , ZnO, CsPbI 2 Br and FA 0.6 MA 0.4 Sn 0.5 Pb 0.5 I 3 , were obtained from previous literature. [22][23][24][25][26][27][28][29][30][31] The simulations were performed at room temperature (300K). To address convergence issues, the Newton method and the Newton trap approach were employed as iterative techniques.…”