2018
DOI: 10.1007/s10854-018-0008-y
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Effect of ultrasonic vibration on the interfacial IMC three-dimensional morphology and mechanical properties of Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu halogen free solder joints

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Cited by 7 publications
(8 citation statements)
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“…The IMC locates at the interface of solder seam and Cu substrate, and it grows towards the solder seam as shown in Figure 4(b). Previous research has shown that the interface IMC morphology and the dimension of a lead-free solder joint influenced performance and reliability [27]. In this paper, the average thickness (d) and the roughness (R) of the IMC layer are used to characterize the morphology and size of interface IMC, and investigate its effect on the reliability of the solder joints.…”
Section: Microstructure Of Sn25ag07cu01rexni/cu Solder Joints Aftementioning
confidence: 99%
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“…The IMC locates at the interface of solder seam and Cu substrate, and it grows towards the solder seam as shown in Figure 4(b). Previous research has shown that the interface IMC morphology and the dimension of a lead-free solder joint influenced performance and reliability [27]. In this paper, the average thickness (d) and the roughness (R) of the IMC layer are used to characterize the morphology and size of interface IMC, and investigate its effect on the reliability of the solder joints.…”
Section: Microstructure Of Sn25ag07cu01rexni/cu Solder Joints Aftementioning
confidence: 99%
“…Up to now, the Sn2.5Ag0.7Cu0.1RE0.05Ni solder was systematically studied by Zhang Keke's research group. The research includes process optimization [28], the methods (with ultrasound and electric field) improving the strength of the joint [27,29], as well as thermal shock of the Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu joints [30,31], The Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu joints were…”
Section: Microstructure Of Sn25ag07cu01rexni/cu Solder Joints Aftementioning
confidence: 99%
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