Effect of void morphology on void facilitated plasticity in irradiated Cu/Nb metallic nanolayered composites

Yan, Zhe; Liu, Zhaorui; Kong, Xiangfei; Yao, B.N.; An, Qi; Jiang, Shuimiao; Zhang, Ruifeng; Beyerlein, Irene J.; Zheng, Shijian

doi:10.1016/j.jnucmat.2021.153380

Cited by 9 publications

(2 citation statements)

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“…They noticed that in reality, the voids were faceted, and therefore, one can expect the dislocation emission from the edges at the void surface. In this case, "the critical length determining dislocation nucleation is not the void diameter but the length of the void edge and the stress to nucleate the dislocation scales with this length, similar to that from a Frank-Read source" [40]. As a result, the authors came to the following formula for the critical shear stress:…”

Section: Discussionmentioning

confidence: 95%

“…This characteristic value was extremely high and not available under the crystal growth conditions. Yan et al [40] suggested an alternative approach for estimating the critical stress needed for dislocation emission from a void. They noticed that in reality, the voids were faceted, and therefore, one can expect the dislocation emission from the edges at the void surface.…”

Section: Discussionmentioning

confidence: 99%

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Large-Area Mapping of Voids and Dislocations in Basal-Faceted Sapphire Ribbons by Synchrotron Radiation Imaging

Argunova,

Kohn,

Lim

et al. 2023

Materials

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The understanding of structural defects in basal-faceted sapphire ribbons was improved through X-ray imaging at a synchrotron source. The combination of phase contrast and X-ray diffraction makes it possible to visualize and characterize both gas voids and dislocations in the bulk of the ribbons grown by the Stepanov–LaBelle technology. Dislocations were directly related to gas voids. X-ray diffraction topography was employed to investigate the distribution, configurations, and character of the dislocations. The formation of voids of irregular shapes was detected by large-area mapping with spatial resolution in the μm range. Computer simulations of the experimental phase contrast images of microvoids were performed. The sizes of the spherical microvoids were determined. The results are discussed with reference to the available data on the emission of dislocations from the voids. The evolution of the shape, size, and arrangement of the voids during growth provides clues on the formation of block structure in basal-faceted sapphire ribbons.

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Section: Discussionmentioning

confidence: 95%

Section: Discussionmentioning

confidence: 99%