PXRD technique has non-destructive nature, marked sensitivity, reliability, simple and fast sample preparation, user friendly, convenient, fast speed, high resolution, minimum maintenance cost, proper automation, easy interpretation of the information that could be utilized for both qualitative and quantitative aspects of analysis. It is the primary tool for solid state characterization. Material characterization provides the information about the particle size, crystallite size, phase transitions, texture, strain broadening, crystal structure and lattice parameters. It can be used to study the crystallinity, crystalline index, identify the crystalline phases, spacing between lattice planes, scales of existence, preferential order and epitaxial growth of crystallites. Every material or compound has its unique diffraction patterns so materials and compounds can be identified by comparing a database of diffraction patterns. The purity of a sample can be accessed by diffraction pattern (Figure 1) by taking into consideration the proportion and composition of impurities present. PXRD is the prime requisite for differentiating the crystalline sample ( Figure 2) from semi-crystalline like in polymer like cotton and amorphous materials like phenol-formaldehyde complex resin ( Figure 3) [1][2][3][4][5][6][7][8].XRD is helpful in qualitative and quantitative phase abundance analysis. It can identify the polymorph and determine the phase abundance to classify the cement and correlating the performance with composition [9][10][11][12][13][14][15].
Material CharacterizationX-rays were discovered by German Scientist Röntgen in 1868. Von Laue in 1912 discovered X-ray diffraction by crystals. The wavelength of X-rays is similar to the distance between atoms. Atoms in a crystal form a periodic array of coherent scatters. When each object in a periodic array scatters radiation coherently the diffraction occurs that leads to constructive interference at each specific angle. Diffraction from different planes of atom produces a diffraction pattern (diffractogram) that contains information about the atomic arrangement in the crystal (Figure 1). We get information like d-value and peak position at 2-theta scale.The peak position at 2 theta scale depends on instrumental characteristics such as wavelength. The peak position as d hkl is an intrinsic, instrument-independent, material property. XRD diffraction intensity depends upon polarization factor, structure factor (F 2 ), multiplicity factor, Lorentz factor, absorption factor and temperature factor. The diffraction pattern for every phase is as unique as fingerprint. Phases with the same chemical composition can have drastically different diffraction patterns. Peak areas are much more reliable than peak heights as a measure of intensity. Crystallites smaller than 120 nm create broadening of diffraction peaks. Micro strain may also create peak broadening. Presence of coarse particles and bad loading cause several negative effects such as preferred orientation, pattern shifts, poor re...