Articles you may be interested inPolarization fatigue in Pb Zr 0.45 Ti 0.55 O 3 -based capacitors studied from high resolution synchrotron x-ray diffraction J. Appl. Phys. 97, 064108 (2005); Room temperature aging behavior of thermally imprinted Pt/SrBi 2 Ta 2 O 9 /Pt ferroelectric thin film capacitors Elementary Pt/ SrBi 2 Ta 2 O 9 / Pt ferroelectric capacitors have been structurally characterized by x-ray diffraction using highly brilliant synchrotron radiation. A microstructural analysis of the stacked layers was performed from the collection of high-quality one-dimensional and two-dimensional diffraction patterns. During x-ray diffraction experiments, peculiar electrical behaviors under irradiation were evidenced. Indeed, depending upon their initial state ͑poled or nonpoled͒, the capacitors have exhibited drastic changes in their electrical characteristics after or under irradiation, both "fatiguelike" ͑polarization reduction͒ and/or "imprintlike" ͑voltage shift͒ phenomena being observed. Using a sample environment specially designed to measure in situ the evolutions of ferroelectric characteristics, the kinetics of both degradation and restoration of ferroelectric properties of the SrBi 2 Ta 2 O 9 -based capacitors under x-ray radiation have been analyzed. Reduction and recovery of switchable polarization have been explained in terms of interaction between ferroelectric domain configuration and photoinduced charge carriers. Mechanisms of charge trapping proposed in the literature are discussed to explain aging and rejuvenation.[This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 216.165.95.69 On: Mon, 08 Dec 2014 06:50:08 044106-2 Menou et al. J. Appl. Phys. 97, 044106 ͑2005͒ [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 216.165.95.69 On: Mon, 08 Dec 2014 06:50:08 044106-3 Menou et al. J. Appl. Phys. 97, 044106 ͑2005͒ [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 216.165.95.69 On: Mon, 08 Dec 2014 06:50:08 044106-4 Menou et al. J. Appl. Phys. 97, 044106 ͑2005͒ [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 216.165.95.69 On: Mon, 08 Dec 2014 06:50:08 044106-5 Menou et al. J. Appl. Phys. 97, 044106 ͑2005͒ [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 216.165.95.69 On: Mon, 08 Dec 2014 06:50:08 044106-6 Menou et al. J. Appl. Phys. 97, 044106 ͑2005͒ [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: ...