Effective interface treatment by zirconium acetylacetonate for inverted methylammonium-rich perovskite solar cells

Li, Yunlong; Zhao, Bo; Cao, Fengxian; Chen, Huiwen; Zhu, Ziyao; Yang, Xiaojing; Wang, Xiao; Sun, Weihai

doi:10.1016/j.mtphys.2023.101106

Cited by 4 publications

(2 citation statements)

References 43 publications

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“…Unfortunately, the signal baseline drift of perovskite-based detectors cannot be adequately suppressed even under small or zero bias conditions. ,− Several strategies, such as utilizing Lewis acid–base additives or employing surface passivation layers, have been proposed for passivating grain boundaries. However, the effectiveness of these approaches is limited in suppressing ion migration compared to that of single crystals. − …”

Section: Introductionmentioning

confidence: 99%

Polycrystalline Lead-Free Perovskite Direct X-Ray Detectors with High Durability and Low Limit of Detection via Low-Temperature Coating

Zhao,

Chen,

Zhu

et al. 2024

ACS Appl. Mater. Interfaces

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Direct X-ray detectors represent a transformative technology in the realm of radiography and imaging. The double halide-based perovskite cesium silver bismuth bromide (Cs 2 AgBiBr 6 ) has emerged as a promising material for use in direct X-ray imaging, owing to its nontoxic composition, strong X-ray absorption, decent charge mobility lifetime product (μτ), and low-cost preparation. However, formidable issues related to scalability and ion migration, stemming from intrinsic factors such as halogen vacancies and grain boundaries, have presented significant impediments. These issues have been associated with substantial noise, baseline instability, and a curtailment of detection performance. In response to these multifaceted challenges, we propose a slurry-based in situ treatment technique for fabricating robust Cs 2 AgBiBr 6 thick films. This novel approach adeptly mitigates halogen vacancies, actively passivates grain boundaries, and concurrently elevates the ion migration activation energy, thus effectively suppressing ion migration. Consequently, the obtained X-ray detector exhibits excellent operating stability with minimal signal drift of 8.5 × 10 −9 nA cm −1 s −1 V −1 and achieves a remarkable 385% increase in sensitivity with a limit of detection as low as 7.8 nGy air s −1 . These results mark a significant step toward the development of high-performance and long-lasting lead-free perovskite direct X-ray detectors.

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Section: Introductionmentioning

confidence: 99%

Polycrystalline Lead-Free Perovskite Direct X-Ray Detectors with High Durability and Low Limit of Detection via Low-Temperature Coating

Zhao,

Chen,

Zhu

et al. 2024

ACS Appl. Mater. Interfaces

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“…Based on the above findings, it appears that C 10 H 14 O 5 Ti is capable of successfully passivating the surface defects of perovskite films, optimizing the arrangement of interfacial energy levels, and inhibiting the nonradiative recombination. 55,56 TRPL measurements on the films were also performed, and the findings are displayed in Figure S6b. A double exponential function fits the TRPL curve well.…”

Section: Dynamics Of Nonradiative Energymentioning

confidence: 99%

Reducing Interfacial Losses in Solution-Processed Integrated Perovskite-Organic Solar Cells

Weng,

Liao,

et al. 2024

ACS Appl. Mater. Interfaces

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Low bandgap organic semiconductors have been widely employed to broaden the light response range to utilize much more photons in the inverted perovskite solar cells (PSCs). However, the serious charge recombination at the heterointerface contact between perovskite and organic semiconductors usually leads to large energy loss and limits the device performance. In this work, a titanium chelate, bis(2,4-pentanedionato) titanium(IV) oxide (C 10 H 14 O 5 Ti), was directly used as an interlayer between the perovskite layer and organic bulk heterojunction layer for the first time. Impressively, it was found that C 10 H 14 O 5 Ti can not only increase the surface potential of perovskite films but also show a positive passivation effect toward the perovskite film surface. Drawing from the above function, a smoother perovskite active layer with a higher work function was realized upon the use of C 10 H 14 O 5 Ti. As a result, the C 10 H 14 O 5 Ti-modified integrated devices show lower interfacial loss and obtain the best power conversion efficiency (PCE) of up to 20.91% with a high voltage of 1.15 V. The research offers a promising strategy to minimize the interfacial loss for the preparation of high-performance perovskite solar cells.

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Highly Efficient Integrated Perovskite/Organic Bulk-Heterojunction Solar Cells Combining Layer-By-Layer Processing Ternary Systems and Interface Modification

He,

Xu,

Zhang

et al. 2024

ACS Appl. Energy Mater.

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Effective interface treatment by zirconium acetylacetonate for inverted methylammonium-rich perovskite solar cells

Cited by 4 publications

References 43 publications

Polycrystalline Lead-Free Perovskite Direct X-Ray Detectors with High Durability and Low Limit of Detection via Low-Temperature Coating

Polycrystalline Lead-Free Perovskite Direct X-Ray Detectors with High Durability and Low Limit of Detection via Low-Temperature Coating

Reducing Interfacial Losses in Solution-Processed Integrated Perovskite-Organic Solar Cells

Highly Efficient Integrated Perovskite/Organic Bulk-Heterojunction Solar Cells Combining Layer-By-Layer Processing Ternary Systems and Interface Modification

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