Hybrid materials
of π-conjugated molecular semiconductors
combined with two-dimensional (2D) materials exhibit a significant
potential for novel (opto)electronics. The overall characteristics
of molecular growth, such as molecular packing, crystallographic structure,
and morphology, determine the specific application. The growth studies
are thus key for understanding and improving these systems. So far,
a simultaneous real-time study of the thin film morphology
evolution along with its crystalline phase on a 2D substrate has not
been performed. Here, we report on an additional feature of surface-sensitive
grazing-incidence wide-angle X-ray scattering (GIWAXS). We show that
refraction induced multiple scattering effects can be employed to
reveal the morphology-related growth modes of a thin organic layer
on a 2D underlayer together with the crystallographic structure and
molecular orientation. A thorough description of the dynamic scattering
effects is provided, allowing a detailed study of the Bragg peak splitting
in the out-of-plane direction. We discuss the influence of the material-related
parameters, such as stress and growth type, on the mutual position
of the split peaks during the growth. Furthermore, we show that the
time-resolved GIWAXS enables the observation of the electron density
variation in real time. Our findings should be considered as a general
feature of GIWAXS that can be applied to various types of thin films,
where the temporal evolution of morphology, molecular arrangement,
and crystallographic structure are of interest.