Effective piezoelectric coefficient measurement of BaTiO3 thin films using the X-ray diffraction technique under electric field available in a standard laboratory

Measurement of independent piezoelectric moduli of Ca3NbGa3Si2O14, La3Ga5.5Ta0.5O14 and La3Ga5SiO14 single crystals

“…The values of the piezoelectric moduli of ferroelectric crystals are one or two orders of magnitude greater than those of piezoelectric but non-ferroelectric crystals, so that the application of an electric field causes much larger changes in angular positions of the diffraction peaks. This has made it possible to carry out measurements on crystals without high structural perfection: a ferroelectric crystal of Rochelle salt (dos Santos et al, 2001) and a ferroelectric thin film of BaTiO 3 (Thery et al, 2015). For the thin film of BaTiO 3 a linear dependence of the deformation on the applied electric field was found within a range several times higher than the value of the coercive field for this material.…”

Исследования Проводящих И Сегнетоэлектрических Свойств BZT-пленок

“…пленки (100 nm). Величина измеренного коэффициента d z z оказалась более чем на порядок ниже, чем характерные значение пьезомодуля в пленке BaTiO 3 (d z z ∼ 50 pm/V) [19]. Стоит отметить, что измеряемое СЗМ зондом значение d z z оказывается в несколько раз заниженным, а E c завышенным из-за эффекта падения потенциала в приконтактной области зонд−поверхность.…”

In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

“…In addition, strain and piezoelectric properties of ferroelectric thin films can be measured quantitatively using time-resolved in situ synchrotron X-ray diffraction (XRD) with the appropriate spatial resolution and the sample under an applied electric field [17][18][19][20]. In situ high-resolution XRD has been performed to study the switching behavior of 90°domains in epitaxial tetragonal PZT thin films under applied bias voltage [21][22][23][24], as well as to investigate the electromechanical properties and the origin of the polarization fatigue in highly (111) and (001) oriented tetragonal PZT thin films [25,26].…”