2007
DOI: 10.1063/1.2772505
|View full text |Cite
|
Sign up to set email alerts
|

Effective removal of field-emitting sites from metallic surfaces by dry ice cleaning

Abstract: Systematic results of the field emission properties of polycrystalline copper and niobium and single-crystal Nb are reported. Dry ice cleaning ͑DIC͒ is found to suppress enhanced field emission from metallic surfaces. The cleaning effect on the emitting sites was investigated by means of field emission scanning microscopy up to fields of 250 MV/m and high-resolution scanning electron microscopy with energy dispersive x-ray analysis. The number density of emitters at given fields was drastically reduced by dry … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
9
0

Year Published

2009
2009
2021
2021

Publication Types

Select...
6
2

Relationship

1
7

Authors

Journals

citations
Cited by 12 publications
(9 citation statements)
references
References 16 publications
0
9
0
Order By: Relevance
“…The removal of particulates, light organics, and photoresist residues less than 100 nm in size from surfaces of photomask substrates, etched wafers, and semiconductors was investigated by Brandt [15], Dangwal et al [26], Kosic and Palser [27], and Yang et al [10]. Loosely bound contaminants and particles were successfully removed by CO 2 snow, and the gas spray was sufficient to carry off the loosened particles.…”
Section: Dry-ice Cleaning Applicationsmentioning
confidence: 99%
“…The removal of particulates, light organics, and photoresist residues less than 100 nm in size from surfaces of photomask substrates, etched wafers, and semiconductors was investigated by Brandt [15], Dangwal et al [26], Kosic and Palser [27], and Yang et al [10]. Loosely bound contaminants and particles were successfully removed by CO 2 snow, and the gas spray was sufficient to carry off the loosened particles.…”
Section: Dry-ice Cleaning Applicationsmentioning
confidence: 99%
“…The composition of organic contaminants before and after cleaning was analyzed using X-ray photoelectron spectroscopy. Furthermore, the cleaning performance of dry ice blasting was investigated using infrared spectroscopy (Hills et al 1995), and field emission scanning microscopy (Dangwal et al 2007). Dry ice cleaning methods have excellent performance for many applications such as the cleaning of products or equipment in electrical, automobile, and food industries, etc.…”
Section: Introductionmentioning
confidence: 99%
“…Field emission scanning microscopy (FESM) and correlated SEM measurements with energy-dispersive X-ray spectroscopy (EDX) of Nb and Cu samples relevant for recent accelerating structures confirmed particulates and surface defects as main origin of EFE with field enhancement factors β ¼ 10 À 120 and typical emission areas S ¼ 10 À 4 À 10 4 μm 2 [8][9][10]. Although the emitter number density N can be significantly reduced by high pressure rinsing [11,12] and dry ice cleaning [13,14], N increases strongly even on cleaned surfaces with the applied macroscopic electric surface field E s . It is remarkable, that field emitters on Nb usually become activated at a certain field level E s ¼ E act , which is usually much higher than the final macroscopic onset field E on , both defined for a current of 1 nA.…”
Section: Introductionmentioning
confidence: 99%