2019
DOI: 10.1109/jphot.2019.2944968
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Effectively Identifying the Topological Charge and Polarization Order of Arbitrary Singular Light Beams Based on Orthogonal Polarization Separating

Abstract: Singular beams with spatially variant field distributions have various fantastic applications. However, one of the significant challenges that hinder the wide application of singular beams is how to effectively identify the topological charge and the polarization order of arbitrary singular beams. We found that when a light beam with arbitrary polarization state illuminates a polarization-sensitive blazed-grating, the horizontal and vertical component can be separated from the incident beam. Based on this phen… Show more

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Cited by 2 publications
(1 citation statement)
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“…In this approach, the diffraction pattern becomes difficult to analyze for high-order VV beams. Another approach is to measure the TC of the orthogonal components of the input VV beam by analyzing a pair of interferograms recorded using a reference beam 57 . Interference-based methods are intuitive and have simpler implementation.…”
Section: Introductionmentioning
confidence: 99%
“…In this approach, the diffraction pattern becomes difficult to analyze for high-order VV beams. Another approach is to measure the TC of the orthogonal components of the input VV beam by analyzing a pair of interferograms recorded using a reference beam 57 . Interference-based methods are intuitive and have simpler implementation.…”
Section: Introductionmentioning
confidence: 99%