2023 IEEE 33rd International Conference on Microelectronics (MIEL) 2023
DOI: 10.1109/miel58498.2023.10315932
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Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation

S. Veljković,
N. Mitrović,
S. Djorić-Veljković
et al.
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