Effects of annealing on doped and undoped ion beam synthesised CoSi2 structures

Reeson, K.J.; Hunt, Tim D.; Spraggs, R.S.; Gwilliam, R.; Sealy, B.J.; Meekison, C.D.; Booker, G. R.

doi:10.1016/0168-583x(94)95742-8

Cited by 5 publications

(1 citation statement)

References 15 publications

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“…Several techniques for determining the elemental composition, depth profile or surface morphology have been used. Rutherford back-scattering spectrometry (RBS), 1 accelerator mass spectrometry (AMS), 2 X-ray photoelectron spectroscopy (XPS), 3 Auger electron spectroscopy (AES), 4 scanning tunnelling microscopy (STM), 5 atomic force microscopy (AFM), 6 Raman spectroscopy 7 and infrared spectroscopy (IR) 8 have been applied satisfactorily as surface characterisation tools. Laserna and co-workers have proposed the use of laser-induced breakdown spectrometry (LIBS) for the surface analysis with in-depth and lateral resolution of different samples of interest in industrial and environmental fields, such as photogalvanic cells, 9,10 silicon wafers, 11,12 coated steels, [13][14][15][16] photovoltaic solar cells, 17 catalytic converters 18 and pigments.…”

Section: Introductionmentioning

confidence: 99%

Laser-induced breakdown spectrometry in the jewellery industry. Part I. Determination of the layer thickness and composition of gold-plated pieces

Jurado-López

Castro

2002

J. Anal. At. Spectrom.

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Section: Introductionmentioning

confidence: 99%

Laser-induced breakdown spectrometry in the jewellery industry. Part I. Determination of the layer thickness and composition of gold-plated pieces

Jurado-López

Castro

2002

J. Anal. At. Spectrom.

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In‐depth characterization of screen‐printed electrodes by laser‐induced breakdown spectrometry and pattern recognition

Amador-Hernández

Fernández-Romero

Castro

2001

Surface & Interface Analysis

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The application of laser-induced breakdown spectrometry (LIBS) and chemometrics [namely principal component analysis (PCA) and cluster analysis (CA)] is presented for the characterization of screenprinted electrodes with in-depth resolution. An Nd : YAG laser operating at the fundamental wavelength of 1064 nm was focused on the sample and the plasma emission was collected by a fibre-optic bundle coupled to a spectrograph-charge-coupled device system. The experimental variables were optimized for a satisfactory spatial characterization. The different zones of the screen-printed electrode were studied (working electrode, reference electrode and electrical contacts) in order to identify both the composition and distribution of the layers deposited on the inert support for the construction of the electronic device. Carbon, gold, silver, platinum, palladium, titanium and aluminium were identified as major components. The use of pattern recognition techniques (PCA and CA) for the statistical treatment of the spectroscopy data obtained by LIBS proved to be a powerful tool for the rapid analysis of miniaturized multilayer electronic devices.

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