2009
DOI: 10.1007/s00339-009-5366-0
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Effects of annealing process on asymmetric coercivities of Mn-doped BiFeO3 thin films

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Cited by 14 publications
(12 citation statements)
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“…It is worth noting that the P r for the films also show weak dependent on the film thickness, the values are in the range of 45-50 C/cm 2 , which are much larger than those of the BFO/Pub(Zr 0.5 Ti 0.5 )O 3 (11.9 C/cm 2 ), Now we discuss the asymmetric coercive fields of the asymmetric Bi 0.89 Ti 0.11 FeO 3 /PZTN bi-layered structures. Generally, the asymmetric coercivities can be frequently observed in BFO-based thin films prepared using the pulsed laser deposition (PLD) technique and metal organic decomposition (MOD) method [10,18,19]. Our recent work demonstrated that the asymmetric coercive fields are related to the preferential polarization direction formed in the BFO-based films [19].…”
Section: Resultsmentioning
confidence: 97%
“…It is worth noting that the P r for the films also show weak dependent on the film thickness, the values are in the range of 45-50 C/cm 2 , which are much larger than those of the BFO/Pub(Zr 0.5 Ti 0.5 )O 3 (11.9 C/cm 2 ), Now we discuss the asymmetric coercive fields of the asymmetric Bi 0.89 Ti 0.11 FeO 3 /PZTN bi-layered structures. Generally, the asymmetric coercivities can be frequently observed in BFO-based thin films prepared using the pulsed laser deposition (PLD) technique and metal organic decomposition (MOD) method [10,18,19]. Our recent work demonstrated that the asymmetric coercive fields are related to the preferential polarization direction formed in the BFO-based films [19].…”
Section: Resultsmentioning
confidence: 97%
“…This is because valence states of Fe ions and their percentages are closely connected to the oxygen vacancy amounts caused by a charge compensation effect, which can form to be ðV O 2 À Þ :: ÀðFe 2 þ Fe 3 þ Þ 0 and play an important role in electrical properties of films [19]. Accordingly, it is very necessary to study the narrow-scan XPS spectra of Fe 2p to get the valence information for further electrical properties analysis.…”
Section: Resultsmentioning
confidence: 99%
“…Note that the BFMO films in this work were annealed in N 2 at 525 • C that was much lower than the Curie temperature of BFO (850 • C). Therefore, aging can inevitably occur because of the formation of defect complexes between (V O 2− )•• and (A 2+ Fe 3+ ) [15,16]. The polarization (P D ) of defect complexes can align along the direction of P S during aging [21], which in turn provides a driving force to hinder the switching of ferroelectric domains and eventually reverse as-switched domains to their original orientations (i.e., domain backswitching) [16].…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, aging can inevitably occur because of the formation of defect complexes between (V O 2− )•• and (A 2+ Fe 3+ ) [15,16]. The polarization (P D ) of defect complexes can align along the direction of P S during aging [21], which in turn provides a driving force to hinder the switching of ferroelectric domains and eventually reverse as-switched domains to their original orientations (i.e., domain backswitching) [16]. Therefore, the larger P r value of BFMO 10 min film than that of BFMO 2 min film should be due to the less defect complexes formed during the annealing treatment, which should result from the less (V O 2− )•• because of the smaller volume fraction of grain boundaries.…”
Section: Resultsmentioning
confidence: 99%
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