2019
DOI: 10.1007/s00542-019-04653-3
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Effects of coupling in piezoelectric multi-beam structure

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Cited by 16 publications
(18 citation statements)
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“…Therefore, the SSHI circuit is tested for the variation in the C p values. The variation in the magnitude of input vibration gets reflected in the form of amplitude variation in the current i p [24]. The circuit is tested for the 50% variation in the magnitude of i p keeping f p constant.…”
Section: Circuit Robustnessmentioning
confidence: 99%
“…Therefore, the SSHI circuit is tested for the variation in the C p values. The variation in the magnitude of input vibration gets reflected in the form of amplitude variation in the current i p [24]. The circuit is tested for the 50% variation in the magnitude of i p keeping f p constant.…”
Section: Circuit Robustnessmentioning
confidence: 99%
“…When the PZ cantilever operates in 31 modes, stress generates in the lateral direction (X direction or 3 direction) and an electric field in the transverse direction (Z direction or 1 direction). So, equations (1a) and (1b) show the PZ property and inverse PZ property [5,6].…”
Section: Electrical Analysis Of Piezoelectric Cantilevermentioning
confidence: 99%
“…When the rectangular cantilever structure vibrates vertically, stress acts in the x, y and xy plane. So, the applied stress, strain and electric field in the PZ layer are related as in equations (3) (a, b, c) [5,6].…”
Section: Electrical Analysis Of Piezoelectric Cantilevermentioning
confidence: 99%
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