2015
DOI: 10.1016/j.ceramint.2015.05.089
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Effects of Cu stoichiometry on the microstructure, electrical conduction, and dielectric responses of Y2/3Cu3Ti4O12

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Cited by 17 publications
(4 citation statements)
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“…The better dielectric properties of NLCTO-50 should be closely correlated with the observed Cu-rich grain boundaries in these samples. The occurrence of Cu-rich phase in the grain boundaries and its role in enhancing the dielectric properties have been previously reported for Y 2/3 Cu 3 Ti 4 O 12 [38] and CCTO. [39] Even if a direct comparison with literature is difficult due to the different preparation methods and conditions used, we argue that the results in the present work are comparable to those reported in the literature: ε ∼ 8.7 × 10 3 & tan δ ∼ 0.114 (at 1.1 kHz) for NLCTO ceramics prepared by conventional solid state reaction [30] and ε ∼ 1.53 × 10 4 & tan δ ∼ 0.063 at 1 kHz for NLCTO ceramics prepared by sol-gel method.…”
Section: Resultsmentioning
confidence: 54%
“…The better dielectric properties of NLCTO-50 should be closely correlated with the observed Cu-rich grain boundaries in these samples. The occurrence of Cu-rich phase in the grain boundaries and its role in enhancing the dielectric properties have been previously reported for Y 2/3 Cu 3 Ti 4 O 12 [38] and CCTO. [39] Even if a direct comparison with literature is difficult due to the different preparation methods and conditions used, we argue that the results in the present work are comparable to those reported in the literature: ε ∼ 8.7 × 10 3 & tan δ ∼ 0.114 (at 1.1 kHz) for NLCTO ceramics prepared by conventional solid state reaction [30] and ε ∼ 1.53 × 10 4 & tan δ ∼ 0.063 at 1 kHz for NLCTO ceramics prepared by sol-gel method.…”
Section: Resultsmentioning
confidence: 54%
“…However, CCTO is believed up to date as a promising material among the large number of perovskite-related oxides, while recently several other oxides of ACu 3 Ti 4 O 12 type have also been confirmed by experiments to exhibit high dielectric constant behaviors. Y 2/3 Cu 3 Ti 4 O 12 (YCTO) is compositionally and structurally similar to that of CCTO which exhibits the giant dielectric-permittivity (ε r > 10 4 ) with good thermal stability (12). While YCTO may be promising material for the near future application in the electronic device, but only very few works have been reported (13).…”
Section: Introductionmentioning
confidence: 99%
“…The structural defects caused by the segregation of CuO with the higher resistance drift rate for Cu-based oxide ceramics have been a hot topic of discussion. [19][20][21][22] However, the problem has not been adequately addressed. Therefore, it is difficult to predict the practicality of YCTO ceramics.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the thermosensitive properties and stability evaluation of YCTO ceramics have not been reported. The structural defects caused by the segregation of CuO with the higher resistance drift rate for Cu‐based oxide ceramics have been a hot topic of discussion 19–22 . However, the problem has not been adequately addressed.…”
Section: Introductionmentioning
confidence: 99%