2017
DOI: 10.1364/oe.25.004607
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Effects of deep wet etching in HF/HNO_3 and KOH solutions on the laser damage resistance and surface quality of fused silica optics at 351 nm

Abstract: We investigate the interest of deep wet etching with HF/HNO3 or KOH solutions as a final step after polishing to improve fused silica optics laser damage resistance at the wavelength of 351 nm. This comparison is carried out on scratches engineered on high damage threshold polished fused silica optics. We evidence that both KOH and HF/HNO3 solutions are efficient to passivate scratches and thus improve their damage threshold up to the level of the polished surface. The effect of these wet… Show more

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Cited by 47 publications
(15 citation statements)
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“…First results were obtained with a buffered oxide etch 11 , 13 . Similar effects were reported with HF etching 14 and KOH etching 15 as well. Although the positive impact of pronounced wet etching on the scratch damage threshold at 351 nm is unquestionable, the physical mechanisms explaining this effect are more elusive.…”
Section: Introductionsupporting
confidence: 86%
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“…First results were obtained with a buffered oxide etch 11 , 13 . Similar effects were reported with HF etching 14 and KOH etching 15 as well. Although the positive impact of pronounced wet etching on the scratch damage threshold at 351 nm is unquestionable, the physical mechanisms explaining this effect are more elusive.…”
Section: Introductionsupporting
confidence: 86%
“…Wet chemical etching, described by the stars, increases the scratch width-to-depth ratio, and leads to a decrease in the intensity enhancement in fused silica. However, this reduction of intensity enhancement is limited compared to the laser damage improvement previously reported 11 , 13 , 15 , 25 . Indeed, modeling a scratch by a triangle is too great an approximation.…”
Section: Resultsmentioning
confidence: 66%
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“…Chemical acid etching and careful cleaning have been demonstrated to be the most effective method for removing the SSD and improving the damage resistance of fused silica. 27,28 However, deep chemical etching generally leads to the degradation of surface quality (upper part on the right in Fig. 8), which can enhance scattering and loss of laser beam energy.…”
Section: Resultsmentioning
confidence: 99%
“…Treatment with KOH was done by placing the substrate in ultrasonic agitation (Cole-Parmer 8891) in a solution of KOH with a concentration of 40.02% (mass per volume) at 48°C for six hours. At this temperature, we estimate that 100 nm of the silica layer were removed [25].…”
Section: Magnetic Field Detectionmentioning
confidence: 97%