2015
DOI: 10.1007/s10854-015-3693-9
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Effects of excess Bi on structure and electrical properties of BiFeO3 thin films deposited on indium tin oxide substrate using sol–gel method

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Cited by 12 publications
(12 citation statements)
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“…So, work is needed to understand the nature of defects giving rise to high conductivity in GFO, i.e., cations or anions vacancies or valence fluctuations of Fe ions. Similar issues were also faced in well‐studied material bismuth ferrite which is susceptible to having vacancies on Bi site due to Bi volatilization, fluctuations in Fe valence as well as oxygen vacancies . Though site engineering or atomic substitution can reveal some clues about the defect chemistry, often the information is indirect and is also plagued by lack of clear information on the site exchange especially in case of ions with higher atomic size mismatch such as Mg doping of GFO.…”
Section: Introductionmentioning
confidence: 90%
“…So, work is needed to understand the nature of defects giving rise to high conductivity in GFO, i.e., cations or anions vacancies or valence fluctuations of Fe ions. Similar issues were also faced in well‐studied material bismuth ferrite which is susceptible to having vacancies on Bi site due to Bi volatilization, fluctuations in Fe valence as well as oxygen vacancies . Though site engineering or atomic substitution can reveal some clues about the defect chemistry, often the information is indirect and is also plagued by lack of clear information on the site exchange especially in case of ions with higher atomic size mismatch such as Mg doping of GFO.…”
Section: Introductionmentioning
confidence: 90%
“…10,16 The Bi-excess (Bi 1.04 Fe 0.98 O 3.00 , ∇[Bi] = 0%) heterostructures (purple data, Figure 5f) also show nearly ideal dielectric permittivity, consistent with prior work on Bi-excess (up to 10% excess) ceramics wherein bulk-like dielectric permittivity was observed. 34 Upon moving to Bi-deficiency and/or in the presence of ∇[Bi], however, the dielectric permittivity falls dramatically and the variants show a trend inverse to that from the leakage response ( Figure 4d). The reduced dielectric permittivity may be explained by the fact that these heterostructures exhibit the most extensive interfacial interdiffusion and we propose that this interdiffusion creates a region of lower capacitance which dominates the dielectric response of the films.…”
Section: Chemistry Of Materialsmentioning
confidence: 96%
“…The presence of the (014) and (110) peaks at 2 ≈ 31.5° and 32° reveal a perovskite BFO phase belonging to rhombohedral R3c space group 52,97 , which is present in both samples treated under the same thermal conditions. In addition, a small amount of a secondary phase in the film was detected along with the pure BFO peaks is assigned to Bi2O3, which is in agreement with previous reported study 91,95 . Many literatures have studied the crystal structure of BFO thin films deposited on different substrates.…”
Section: 3supporting
confidence: 92%
“…The film morphology is consistent with previously reported studies of BiFeO3 thin films 71,75 . The formation of voids within bismuth ferrite thin films could be attributed to the volatile of Bi during thermal treatment, which lead to the formation of secondary phases 95,96 , this can be further confirmed by XRD data. The volatilization of Bi is a well-known phenomenon that affects the stoichiometry via the appearance of bismuth and oxygen vacancies 95 .…”
Section: 3supporting
confidence: 52%
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