2006
DOI: 10.1016/j.cattod.2005.11.079
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Effects of experimental parameters on the physical properties of non-stoichiometric sputtered vanadium nitrides films

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Cited by 15 publications
(8 citation statements)
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“…Two diffraction peaks VN (111) and (200) at 43?96 and 51?83u respectively referred to JCPDS (00-073-0528) and a minor V 2 N (110) at 43?03u JCPDS (00-032-1413) are detected; similar peaks were also detected in previous studies. 24 No apparent peak shift is observed for this film. Moreover, minor V 5 O 9 (101) and (0-22) diffraction peaks are located at 30?58 and 35?50u JCPDS (00-018-1450) respectively.…”
Section: Microstructure and Chemical Compositionmentioning
confidence: 77%
“…Two diffraction peaks VN (111) and (200) at 43?96 and 51?83u respectively referred to JCPDS (00-073-0528) and a minor V 2 N (110) at 43?03u JCPDS (00-032-1413) are detected; similar peaks were also detected in previous studies. 24 No apparent peak shift is observed for this film. Moreover, minor V 5 O 9 (101) and (0-22) diffraction peaks are located at 30?58 and 35?50u JCPDS (00-018-1450) respectively.…”
Section: Microstructure and Chemical Compositionmentioning
confidence: 77%
“…Takeyama et al [4,11] have demonstrated that nanocrystalline textured vanadium nitride films grown between Cu and SiO 2 are chemically inert, and do not react with the adjoining layers, and are structurally stable. In the past, vanadium nitride films have been grown by atomic layer deposition [10,13], direct nitridation of vanadium films at elevated temperature [7], reactive electron beam evaporation [6], reactive dc sputtering [4,14,15], pulsed laser deposition [16,17], reactive magnetron sputtering [5,[18][19][20][21][22] and reactive ion beam sputtering [12]. It is known that the chemical composition, microstructure and hence, the material properties (such as optical, electrical and magnetic properties) of vanadium nitride films depend heavily on deposition parameters.…”
Section: Vanadium and Vanadium Nitride Thin Films Grown By High Power...mentioning
confidence: 99%
“…We note that most of the peaks of phases CHARACTERIZATION OF Mo-V-N COATINGS DEPOSITED ON XC100 SUBSTRATE 671 sity of V 2 N (110) at 43.03C. These peaks were also detected for the coatings (V-Ti-N) [20]. A vanadium oxide V 5 O 9 (101) and (0-22) of low intensity peaks were also detected respectively at 30.58C and 35.50C.…”
Section: Resultsmentioning
confidence: 69%