2009
DOI: 10.1016/j.actamat.2008.09.033
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Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface

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Cited by 207 publications
(112 citation statements)
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“…The FIB'ed pillars presented tapering angles of 2-3°, as expected from the annular milling process. These values are in agreement with the results published in the literature for micropiUars manufactured by FIB (Korte and Clegg, 2010;Zhang et al, 2006;Shim et al, 2009). …”
Section: Fig 1 (A)supporting
confidence: 83%
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“…The FIB'ed pillars presented tapering angles of 2-3°, as expected from the annular milling process. These values are in agreement with the results published in the literature for micropiUars manufactured by FIB (Korte and Clegg, 2010;Zhang et al, 2006;Shim et al, 2009). …”
Section: Fig 1 (A)supporting
confidence: 83%
“…This way the truncation of dislocation sources originates the size effects Rao et al, 2008;Akarapu et al, 2010;Ngan, 2011). Recent studies in mechanically pre-strained Mo pillars, both with (Schneider et al, 2010) and without FIB milling (Shim et al, 2009), support this view, because size effects are independent of whether the initial defect distribution is due to FIB machining or mechanical pre-strain. This seems also to be the case for the [100] oriented LiF micropiUars, but not the for [111] oriented LiF pillars reported in this work.…”
Section: Effect Of Micropillar Size and Ion Irradiationmentioning
confidence: 54%
“…We highlight the variety of nanomechanical testing sample fabrication routes reported to date and their resulting initial microstructures, which have been found to have a significant impact on deformation behavior. [4][5][6][7][25][26][27][30][31][32][33][34][35][36][37] We compare our experimental results to the existing models that attempt to explain heterogeneous dislocation nucleation in pillar and thin film geometries. Further, we measure the experimental activation volumes as a means to test the applicability of these models to the deformation of our Cu nanopillars.…”
Section: 14mentioning
confidence: 79%
“…To investigate size effects in pillar geometries, several fabrication routes have been utilized: focused ion beam (FIB) fabrication, [4][5][6][7] vapor-liquid-solid growth, 26 directional solidification, [33][34][35] nanoimprinting, 36,37 cold welding, 27 and electroplating 25,[30][31][32] . FIBfabricated pillars have been studied most extensively, with average pillar diameters ranging from ;100 nm up to several microns.…”
Section: Methodsmentioning
confidence: 99%
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