The emission properties of Si 1Ϫx Ge x alloy nanocrystals (nc-Si 1Ϫx Ge x) in an optical microcavity were studied, and the results were compared with those of nc-Si in the same structure. The cavity consists of two distributed Si/SiO 2 Bragg reflectors ͑DBRs͒ sandwiching a thin SiO 2 film containing nc-Si 1Ϫx Ge x. The commonly observed cavity effects, that is, spectral narrowing, high directionality, and photoluminescence ͑PL͒ enhancement in the normal direction, were observed. In nc-Si 1Ϫx Ge x , PL lifetime was lengthened by cavity formation, while that of nc-Si was shortened. This difference is due to the different dielectric contrast between active layers and DBRs.