2007
DOI: 10.1016/j.jmps.2007.01.011
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Effects of interface dislocations on properties of ferroelectric thin films

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Cited by 31 publications
(18 citation statements)
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“…2(b), the domain pattern near the interface is perturbed by the inhomogeneous but overall compressive strain field of c I dislocation, 34 leading to a "dead layer" of polarization field similar to that observed in ferroelectric thin films. 12,13 On the other hand, we found that c II dislocation significantly increases the ferrotoroidic transition temperature of the nanodot, manifested with a nonzero toroidal moment at temperature over 1000 K. For this case, evolution of the toroidal moment consists of two distinct stages. At high temperature region, the toroidal moment remains small and increases slowly as temperature decreases.…”
mentioning
confidence: 69%
See 1 more Smart Citation
“…2(b), the domain pattern near the interface is perturbed by the inhomogeneous but overall compressive strain field of c I dislocation, 34 leading to a "dead layer" of polarization field similar to that observed in ferroelectric thin films. 12,13 On the other hand, we found that c II dislocation significantly increases the ferrotoroidic transition temperature of the nanodot, manifested with a nonzero toroidal moment at temperature over 1000 K. For this case, evolution of the toroidal moment consists of two distinct stages. At high temperature region, the toroidal moment remains small and increases slowly as temperature decreases.…”
mentioning
confidence: 69%
“…Furthermore, domain pattern, ferroelectric transition temperature, polarization, and other static properties (e.g., electrical conductance) are strongly modified near the "defective" regions. [9][10][11][12][13][14] Although it is still a long way toward "defect engineering," the revealed effects of defects in ferroelectrics during the past decades have provided us an exciting picture.…”
mentioning
confidence: 99%
“…Using the micromechanics concept of eigenstrains, it is possible to introduce any arbitrary distribution of dislocations in a phase-field model, and it has been applied to the domain nucleation and spatial distribution. There have also been attempts to study the various factors that influence the coercive field in bulk single crystals, ceramics, and thin films, including existing domain walls, 26,60,61 twin wall width, 25,62 grain boundaries, [63][64][65] dislocations [66][67][68] as well as strain. 69 There have been a number of other recent developments in the applications of phase-field to ferroelectrics.…”
Section: Summary Remarksmentioning
confidence: 99%
“…The semi-implicit Fourier-spectral method is employed to solve the partial differential equation (21) in the present work. 34 In the present study, two dimensional (2D) phase field simulation were conducted under plane strain condition.…”
Section: Simulation Modelmentioning
confidence: 99%
“…By using the phase field model, the effect of interfacial dislocations on the paraelectric (PE) loop and the domain structure of ferroelectric thin film was investigated. [19][20][21][22] With pre-existed bi-domain structures of 180 /90 domain walls, Kontsos and Landis 22 investigated the interactions between domain walls and an array of dislocations and the pinning strength of the dislocations on domain wall in ferroelectric single crystals by using finite element based phase field approach.…”
mentioning
confidence: 99%