Effects of irradiation damage on the back-scattering of electrons: Silicon-implanted silicon

Nasdala, Lutz; Kronz, Andreas; Grambole, D.; Trullenque, Ghislain

doi:10.2138/am.2007.2648

Cited by 9 publications

(4 citation statements)

References 16 publications

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“…This means that Ti-distribution and CL-activation can potentially be decoupled in zircon. It should be noted that there are also a number of well-documented factors also contribute to CL among minerals, including crystallinity, structure and radiation damage (Nasdala et al, 2007) such that trace element distribution should not solely be considered to correspond to bulk or panchromatic CL intensity.…”

Section: Sem-cl Bse and Ti-distributionmentioning

confidence: 99%

Ti site occupancy in zircon

Tailby

Walker

Berry

et al. 2011

Geochimica et Cosmochimica Acta

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Section: Sem-cl Bse and Ti-distributionmentioning

confidence: 99%

Ti site occupancy in zircon

Tailby

Walker

Berry

et al. 2011

Geochimica et Cosmochimica Acta

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“…1). Note that the backscattered electron (BSE) signal intensity in images of zircon single crystals is correlated with structural damage (Fritzsche and Rothemund 1978;Nasdala et al 2006Nasdala et al , 2007; that is, a lower BSE yield means better crystalline order in a given zircon crystal hosting selfirradiation damage.…”

Section: Introductionmentioning

confidence: 99%

Electron-beam-induced annealing of natural zircon: a Raman spectroscopic study

Nasdala

2016

Phys Chem Minerals

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The annealing of radiation damage in zircon by low-energy electron irradiation was explored systematically. Natural zircon samples spanning a wide range of self-irradiation damage were irradiated with the focused electron beam of an electron probe microanalyser. The effects of beam current and irradiation time were tested systematically, and the changes in zircon were measured using Raman spectroscopy. Our results confirm the damageannealing effect of an accelerated electron beam. We demonstrate that non-thermal annealing occurs through electron-enhanced defect reactions and that the annealing is a function of both the irradiation time and beam current. The complete annealing of radiation damage in zircon by an accelerated electron beam was not possible under the conditions of our experiments. Our results indicate that Raman band broadening in ion-irradiated zircon can possibly be explained through phonon confinement, as the estimated domain sizes of the crystalline volume amid recoil clusters decrease with increasing α dose. The results underlay the importance of doing Raman spectroscopy before electron-beam and ion-beam analysis. To avoid unwanted beam-induced annealing of damage in zircon during EPMA analysis, the electron energy transferred per volume unit of sample should be minimised, for instance by keeping the integrated charge low and/or by defocusing the electron beam.

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“…Lloyd 1987;Prior et al 1999), structural variations, for instance among polymorphs of the same chemical compound (phase contrast; e.g. Mosenfelder 2000;Nasdala et al 2007) and structural defects such as dislocations or micro-porosity (electron channelling contrast; e.g. Kaneko et al 2005;Nasdala et al 2007Nasdala et al , 2009.…”

Section: Introductionmentioning

confidence: 99%

“…Mosenfelder 2000;Nasdala et al 2007) and structural defects such as dislocations or micro-porosity (electron channelling contrast; e.g. Kaneko et al 2005;Nasdala et al 2007Nasdala et al , 2009. Cathodoluminescence imaging reveals the presence of specific structural defects, e.g.…”

Section: Introductionmentioning

confidence: 99%

Visualization of trace-element zoning in fluorapatite using BSE and CL imaging, and EPMA and μPIXE/μPIGE mapping

et al. 2016

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In this paper, zonation patterns of trace elements in fluorapatite are discussed that were visualized using four analytical techniques, namely back-scattered electrons (BSE) and cathodoluminescence (CL) imaging, electron probe micro-analysis (EPMA), and micro-proton-induced X-ray/ gamma ray emission (μPIXE/μPIGE) mapping. Each method demonstrates the in-grain compositional variations in a slightly different way. Both BSE and CL provide qualitative data, and the internal textures are displayed in most detail. Additionally, CL points to specific elements enriched in certain growth zones. Qualitative EPMA maps show detailed zonation patterns for specific elements (with high spatial resolution), which are in general correspondence with the patterns observed in BSE and CL images. The μPIXE/μPIGE maps are fully quantitative and the detection limits are relatively low compared to EPMA mapping. In present spot measurements μPIXE demonstrates lower detection limits than EPMA, however, the latter could be considerably improved by extending the acquisition times. There is no significant overlap of REE (rare earth elements) peaks in the acquired μPIXE energy spectra, however, when multiple REEs are present with sufficiently high concentrations, peak deconvolution may pose some difficulties. Spatial resolution of μPIXE/μPIGE images is not sufficiently high to reflect minor textural features, which also result from the greater interaction depth of the proton beam. However, major growth zones are distinguishable. Even though each method has their advantages and limitations, when applied together, they provide an almost complete characterization of compositional variability in trace-element-bearing minerals.

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Effects of irradiation damage on the back-scattering of electrons: Silicon-implanted silicon

Cited by 9 publications

References 16 publications

Ti site occupancy in zircon

Ti site occupancy in zircon

Electron-beam-induced annealing of natural zircon: a Raman spectroscopic study

Visualization of trace-element zoning in fluorapatite using BSE and CL imaging, and EPMA and μPIXE/μPIGE mapping

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