2011
DOI: 10.1016/j.solmat.2010.09.016
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Effects of low-temperature annealing on polycrystalline silicon for solar cells

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Cited by 8 publications
(4 citation statements)
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“…Although relatively high in efficiency, they suffer from high manufacturing and installation costs. 37-40 (ii) The second generation of thin-film solar cells, e.g., amorphous silicon, 41,42 poly-crystalline silicon, 43,44 cadmium telluride, 45,46 and copper indium gallium selenide. 47,48 These solar cells are significantly less expensive than single-crystalline PV cells due to reduced materials and processing costs, and increased manufacturing throughput.…”
Section: A3 Current Challenges In Photovoltaicsmentioning
confidence: 99%
“…Although relatively high in efficiency, they suffer from high manufacturing and installation costs. 37-40 (ii) The second generation of thin-film solar cells, e.g., amorphous silicon, 41,42 poly-crystalline silicon, 43,44 cadmium telluride, 45,46 and copper indium gallium selenide. 47,48 These solar cells are significantly less expensive than single-crystalline PV cells due to reduced materials and processing costs, and increased manufacturing throughput.…”
Section: A3 Current Challenges In Photovoltaicsmentioning
confidence: 99%
“…The polycrystalline and single-crystal devices had an estimated trap state density of ∼10 9 to 10 10 cm –3 . The trap densities calculated for our samples are lower than other PV absorber materials such as polycrystalline-Si (10 13 –10 14 cm –3 ), , CdTe (10 11 –10 13 cm –3 ), CIGS (10 13 cm –3 ), rubrene (10 16 cm –3 ), and pentacene (10 14 to 10 15 cm –3 ) …”
Section: Resultsmentioning
confidence: 53%
“…The polycrystalline and single-crystal devices had an estimated trap state density of ∼10 9 to 10 10 cm −3 . The trap densities calculated for our samples are lower than other PV absorber materials such as polycrystalline-Si (10 13 − 10 14 cm −3 ), 47,48 CdTe (10 11 −10 13 cm −3 ), 49 CIGS (10 13 cm −3 ), rubrene (10 16 cm −3 ), 50 and pentacene (10 14 to 10 15 cm −3 ). 51 The carrier mobility (μ n ) of the devices was determined from the values of current density J D and applied voltage V at the start of the high bias (Child's) region, shown in Figures 13, S9, and S10, where the approximately quadratic (n = 2) dependence obeys the Mott−Gurney (M-G) law.…”
Section: Dark I−v Study Using Space Charge Limited Current (Sclc)mentioning
confidence: 54%
“…The LBIC mapping technique at different wavelengths together with DLTS enabled researchers to recognize and detect these arrays and to evaluate their recombination strength [84]. A comparison of various techniques may provide precise information about dislocation behaviors [85]. The use of direct-current, continuous-operation, glow discharge mass spectrometry (GDMS) has become an established technique for multi-element investigation of trace-and ultra-trace impurities in highly pure metals and semiconductors [86].…”
Section: Indirect Diagnosis Of Dislocationsmentioning
confidence: 99%