2021
DOI: 10.1016/j.solener.2021.05.031
|View full text |Cite
|
Sign up to set email alerts
|

Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
17
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 34 publications
(17 citation statements)
references
References 38 publications
0
17
0
Order By: Relevance
“…, where d represents the film thickness (cm) and T represents the transmittance. 60 Doing so, the absorption coefficient in neat films was estimated to be 2.81 Â 10 5 cm À1 and 2.92 Â 10 5 cm À1 for Y6 and Y6-12, respectively. 42 Such high absorption coefficients and the broad absorption band of both NFAs in the 600-900 nm range are highly beneficial for effective solar photon absorption, which should translate into high photocurrent in OSCs.…”
Section: Optical Propertiesmentioning
confidence: 97%
“…, where d represents the film thickness (cm) and T represents the transmittance. 60 Doing so, the absorption coefficient in neat films was estimated to be 2.81 Â 10 5 cm À1 and 2.92 Â 10 5 cm À1 for Y6 and Y6-12, respectively. 42 Such high absorption coefficients and the broad absorption band of both NFAs in the 600-900 nm range are highly beneficial for effective solar photon absorption, which should translate into high photocurrent in OSCs.…”
Section: Optical Propertiesmentioning
confidence: 97%
“…The estimated value ≈2.3 agrees well with the dielectric constant reported for non‐stoichiometric WO 3–x thin films. [ 49 ] Analysis of dc conduction behavior suggests that the set operation gives rise to metallic filament formation and current conduction takes place preferentially through the localized conductive filaments when the device is in the ON state. During the reset operation, the conducting filaments get ruptured and conduction takes place uniformly over the entire device area following Schottky emission.…”
Section: Switching Mechanismmentioning
confidence: 99%
“…S8a, ESI†). 58–60 As shown in Table S1 (ESI†), decreasing the t ch of ZITO led to the widening of the energy bandgap. 61 To examine the band alignment of ZITO thin films with different t ch , the XPS valence band spectra were also measured (Fig.…”
Section: Resultsmentioning
confidence: 96%