EFFECTS OF PACKAGING ATMOSPHERE AND ORGANIC CONTAMINATION ON 980 nm LASER DIODE RELIABILITY

Sharps, Julia A.; Jakobson, Paul A.; Hall, D. W.

doi:10.1364/oaa.1994.wd5

Cited by 2 publications

(2 citation statements)

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“…The processes of hydrocarbon deposition have been studied in detail by Sharps et al 41 ' 42 They reported that isopropyl alcohol contamination (the alcohol is used for cleaning the laser chip) and a volatile hydrocarbon in the residual gas in pack ages result in hydrocarbon deposition that under a high photon flux undergoes a photochemical reaction on the facet and results in COD. These kinds of PIF may occur in other high power lasers, although clear data on this topic have not been reported.…”

Section: Instability Of 980 Nm Laser Operation In Dry Nitrogen Gasmentioning

confidence: 99%

“…The Corning group estimated the lifetime of 980 nm lasers under constant current operation at an output power of about 150 mW to be 10 5 hours. 41 The lasers used in the tests were hermetically packaged in N 2 + 20% O2 and with a low hydrocarbon content in order to suppress PIF. AT&T Bell Laboratories presented good systematic results for 980 nm lasers and their modules in LEOS'94, although the data were not published in the conference proceedings.…”

Section: Nm Lasersmentioning

confidence: 99%

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Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

FUKUDA

1996

Selected Topics in Electronics and Systems

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The degradation behavior and the reliability of 980 nm lasers and 1480 nm lasers are reviewed and discussed. In addition, packaging problems for the high power lasers are also discussed from the application viewpoint. For 980 nm lasers the reliability in laser chip is limited mainly by the instability of an interface between the laser material (facet) and the anti-reflecting coating film, and for most 1480 nm lasers the reliability of the laser chip is determined mainly by the instability of a buried heterointerface. These reliability problems have been solved, however, by examining the material properties and improving device fabrication technology. The main packaging problem is a packaginginduced failure (PIF) causing sudden failure in 980 nm lasers sealed in dry N2 or Ar, but packaging problems have also been suppressed or eliminated. The device technology and packaging technology needed to make high power pump laser modules have been established, and erbium-doped fiber amplifiers pumped by these lasers are indispensable components of many optical transmission systems. 55 Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only. Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only.

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Section: Instability Of 980 Nm Laser Operation In Dry Nitrogen Gasmentioning

confidence: 99%

Section: Nm Lasersmentioning

confidence: 99%