2020
DOI: 10.1021/acs.jpcc.0c05503
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Effects of Post-deposition Annealing on Epitaxial CoO/Fe3O4 Bilayers on SrTiO3(001) and Formation of Thin High-Quality Cobalt Ferrite-like Films

Abstract: In order to explore an alternative pathway to prepare ultrathin CoFe2O4 films, epitaxial CoO/Fe3O4 bilayers with varying film thickness of the CoO film were grown on Nb-doped SrTiO3(001) substrates via reactive molecular beam epitaxy. Thereafter, cobalt ferrite films with varying stoichiometry were prepared by post-deposition annealing at different temperatures. The thermally mediated interdiffusion resulted in the formation of vertical compressive and lateral tensile strained Co x Fe3 – x O4 films (x = 0.6 – … Show more

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Cited by 7 publications
(16 citation statements)
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“…In order to gain information on the chemical composition and the homogeneity of the Co and Fe cation distribution of the cobalt ferrite films, a quantitative analysis was performed for each incidence angle mentioned in the experimental details section [ 18 ]. We found for each cobalt ferrite film a homogeneous depth distribution of the Co and Fe cations throughout the whole film.…”
Section: Resultsmentioning
confidence: 99%
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“…In order to gain information on the chemical composition and the homogeneity of the Co and Fe cation distribution of the cobalt ferrite films, a quantitative analysis was performed for each incidence angle mentioned in the experimental details section [ 18 ]. We found for each cobalt ferrite film a homogeneous depth distribution of the Co and Fe cations throughout the whole film.…”
Section: Resultsmentioning
confidence: 99%
“…Two films with stoichiometries of and and total film thicknesses of and , respectively, were prepared by RSPE from epitaxial CoO/Fe O bilayers grown on Nb-doped SrTiO (001) substrates (cf. Figure 1 ) at the beamline BM25-SpLine of the European Synchrotron Radiation Facility (ESRF) [ 18 ]. The sample preparation was extensively monitored by several chemical and structural characterization techniques such as soft and hard X-ray photoelectron spectroscopy and synchrotron radiation based X-ray diffraction including surface sensitive grazing incidence X-ray diffraction to follow the evolution from the CoO/Fe O bilayer stacks to completely reacted Co ferrite films.…”
Section: Methodsmentioning
confidence: 99%
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