2011
DOI: 10.1016/j.ceramint.2011.03.042
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Effects of pre-strain applied at a polyethylene terephthalate substrate before the coating of Al-doped ZnO film on film quality and optical and electrical properties

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Cited by 21 publications
(8 citation statements)
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“…ZnO nanostructures were previously deposited on polymeric substrates [25,26]. Li et al reported the deposition of ZnO on polyethylene-terephthalate (PET) [26].…”
Section: Resultsmentioning
confidence: 99%
“…ZnO nanostructures were previously deposited on polymeric substrates [25,26]. Li et al reported the deposition of ZnO on polyethylene-terephthalate (PET) [26].…”
Section: Resultsmentioning
confidence: 99%
“…Surprisingly, the SnO 2 (2 0 0) peak intensity of the ML-Ni/FTO (0.9 J/cm 2 ) film was higher than that of the L-Ni/FTO (0.9 J/cm 2 ) film, suggesting that magnetic field had a positive effect on improving film crystallinity during laser annealing [33]. In addition, due to partial release of internal stress within the FTO layers of all the annealed Ni/FTO films, the position of the SnO 2 (2 0 0) peaks shifted toward higher 2Â angles as compared to the as-prepared Ni/FTO film [34].…”
Section: Crystal Structurementioning
confidence: 68%
“…2. This shift is owing to the gradual reduction of the residual stress in the Sn0.04Co0.06normalO2 layer 49 . Furthermore, the full width at half maximum (FWHM) of diffraction peaks of allow planes is affected by increasing the exposure time of the He-Ne laser, which indicates possible changes in the crystallite size and microstrain.…”
Section: Resultsmentioning
confidence: 99%
“…This shift is owing to the gradual reduction of the residual stress in the Sn 0.04 Co 0.06 O 2 layer. 49 Furthermore, the full width at half maximum (FWHM) of diffraction peaks of allow planes is affected by increasing the exposure time of the He-Ne laser, which indicates possible changes in the crystallite size and microstrain. This investigation may be credited to the distortion of the crystal lattice and grain size 50 and confirmed the nanocrystalline character of Sn 0.04 Co 0.06 O 2 thin films.…”
Section: Microstructural Analysismentioning
confidence: 99%