2021
DOI: 10.1007/s11664-020-08681-y
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Effects of RF Magnetron Sputtering Deposition Power on Crystallinity and Thermoelectric Properties of Antimony Telluride and Bismuth Telluride Thin Films on Flexible Substrates

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Cited by 12 publications
(6 citation statements)
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“…For PVTC-based composite films, the diffraction peaks appeared at 17.9°, which corresponds to the α phase, and the diffraction peaks observed at 18.5° and 20.1° correspond to the γ phase, , as shown in Figure a. It can be seen that the diffraction peak intensity of PVTC in the SiO 2 -2h/PVTC/SiO 2 -1h/PVTC/SiO 2 -2h (S2PS1S2) and SiO 2 -2h/PVTC/BZT-1h/PVTC/SiO 2 -2h (S2PB1S2) films is inferior to that in the PVTC/SiO 2 -1h/PVTC (PS1P) and PVTC/BZT-1h/PVTC (PB1P) films, which indicates that the INL grown on the surface of PVTC film is good for improving the crystalline structure. , No diffraction peaks corresponding to an inorganic layer of SiO 2 or BZT can be observed, meaning that both SiO 2 and BZT are noncrystallized. Figure b shows the FTIR spectra, the characteristic peaks corresponding to α phase of PVTC are approximately 976 and 532 cm –1 ; the peaks at 812 and 776 cm –1 correspond to the γ phase of PVTC. , To further prove the successful preparation of the insulating layer on the surface of PVTC, the XPS energy spectrum was tested to study the elemental composition.…”
Section: Resultsmentioning
confidence: 89%
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“…For PVTC-based composite films, the diffraction peaks appeared at 17.9°, which corresponds to the α phase, and the diffraction peaks observed at 18.5° and 20.1° correspond to the γ phase, , as shown in Figure a. It can be seen that the diffraction peak intensity of PVTC in the SiO 2 -2h/PVTC/SiO 2 -1h/PVTC/SiO 2 -2h (S2PS1S2) and SiO 2 -2h/PVTC/BZT-1h/PVTC/SiO 2 -2h (S2PB1S2) films is inferior to that in the PVTC/SiO 2 -1h/PVTC (PS1P) and PVTC/BZT-1h/PVTC (PB1P) films, which indicates that the INL grown on the surface of PVTC film is good for improving the crystalline structure. , No diffraction peaks corresponding to an inorganic layer of SiO 2 or BZT can be observed, meaning that both SiO 2 and BZT are noncrystallized. Figure b shows the FTIR spectra, the characteristic peaks corresponding to α phase of PVTC are approximately 976 and 532 cm –1 ; the peaks at 812 and 776 cm –1 correspond to the γ phase of PVTC. , To further prove the successful preparation of the insulating layer on the surface of PVTC, the XPS energy spectrum was tested to study the elemental composition.…”
Section: Resultsmentioning
confidence: 89%
“…It can be seen that the diffraction peak intensity of PVTC in the SiO 2 -2h/PVTC/SiO 2 -1h/PVTC/SiO 2 -2h (S2PS1S2) and SiO 2 -2h/PVTC/BZT-1h/PVTC/SiO 2 -2h (S2PB1S2) films is inferior to that in the PVTC/SiO 2 -1h/PVTC (PS1P) and PVTC/BZT-1h/PVTC (PB1P) films, which indicates that the INL grown on the surface of PVTC film is good for improving the crystalline structure. 24,25 No diffraction peaks corresponding to an inorganic layer of SiO 2 or BZT can be observed, meaning that both SiO 2 and BZT are noncrystallized. Figure 2b shows the FTIR spectra, the characteristic peaks corresponding to α phase of PVTC are approximately 976 and 532 cm −1 ; the peaks at 812 and 776 cm −1 correspond to the γ phase of PVTC.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Taking into account that it has been reported that the increase in crystallinity increases the Seebeck coefficient, this crystallinity enhancement might also contribute to the Seebeck enhancement found in these samples. For instance, in Bi 2 Te 3 when the samples are annealed 24 or have a larger grain size, 25 the Seebeck coefficient can increase up to ten-fold. 24 In the second case, it cannot be ruled out the influence of the topological surface states, which are known to be detrimental to the Seebeck coefficient.…”
Section: Resultsmentioning
confidence: 99%
“…Sputtering is a process that relies on the growth of ad-atoms, whereby the ejected material from the target replicates the textural features of the substrate surface. Comparing the results, it is possible to observe that Cu thin films maintain their crystalline structure, even when deposited on highly porous structured substrates, such as knits. Nevertheless, the same is unclear for the Ti and TiCu 0.34 thin films.…”
Section: Resultsmentioning
confidence: 99%