2011
DOI: 10.1016/j.ijheatmasstransfer.2010.10.026
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Effects of superheat and temperature-dependent thermophysical properties on evaporating thin liquid films in microchannels

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Cited by 52 publications
(66 citation statements)
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“…In the present work the thickness of non evaporation region is considered d 0 ¼ 3 nm as boundary conditions. The specified boundary condition (12-b) is obtained using the shooting method to satisfy the boundary condition at far field of the intrinsic meniscus region [27,34]. Since the thickness of thin film at x ¼ 0 is field region the disjoining pressure is sufficiently small and the meniscus radius approaches the constant value [27].…”
Section: Modelingmentioning
confidence: 99%
“…In the present work the thickness of non evaporation region is considered d 0 ¼ 3 nm as boundary conditions. The specified boundary condition (12-b) is obtained using the shooting method to satisfy the boundary condition at far field of the intrinsic meniscus region [27,34]. Since the thickness of thin film at x ¼ 0 is field region the disjoining pressure is sufficiently small and the meniscus radius approaches the constant value [27].…”
Section: Modelingmentioning
confidence: 99%
“…The effect of an increasing channel width, was an increased thin-film length (Qu et al 2002;Zhao et al, 2011). Du and Zhao (2012) attempted to quantify the effects of using altered evaporation models.…”
Section: Varying Thermophysical Properties Slip Boundary Conditionmentioning
confidence: 99%
“…Because of the geometric symmetry, only one side of the meniscus is considered and the following assumptions are introduced: (1) quasi-steady two-dimensional laminar flow with both the liquid and vapor being incompressible; (2) a pure fluid with the fluid thermophysical properties correlated as polynomial functions of temperature as in our previous studies [11]; (3) gravitational forces and the vapor recoil pressure are neglected; (4) atomically smooth solid surfaces are assumed to be either hydrophilic or hydrophobic; (5) a constant wall temperature, T w , of 344 K and a bulk vapor temperature, T v , varying from 324 to 343 K; (6) combined temperature and velocity slip only occur in the thin-film region; and (7) a two-layer model is used with a liquid-film layer of thickness δ over a nanolayer of thickness l * . The liquid film does not feel the presence of the wall directly due to the nanolayer [14].…”
Section: Thin-film Evaporation Modelmentioning
confidence: 99%
“…(16) with the velocity profiles (u l and u v ). The analytical expressions for u l , u v , dP l /dx, and dP v /dx are given in Zhao et al [11]. The pressure difference between the liquid and vapor at the liquid-vapor interface can be expressed by the augmented Young-Laplace equation…”
Section: Thin-film Evaporation Modelmentioning
confidence: 99%
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