Effects of Surface Topography on Magnetization Reversal of Magnetic Thin Films

Girgis, E.; Sp, Pogossian; Ml, Benkhedar

doi:10.1166/jnn.2006.181

Cited by 5 publications

(2 citation statements)

References 12 publications

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“…The coercivity is decided jointly by domains pinning model or StonerWohlfarth reversal model. As reported [23], high R a is conducive for domains pinning, and large K u⊥ is preventing from StonerWohlfarth reversal. Sr-M films of 200 nm exhibit an almost equal value of K u⊥ ,but a lower R a than that of 150 nm, thus lead a relatively small value of H c⊥ .…”

Section: Resultssupporting

confidence: 52%

Thickness dependence of magnetic properties in La–Co substituted strontium hexaferrite films with perpendicular anisotropy

Hui

Cheng

Yan

et al. 2015

Journal of Magnetism and Magnetic Materials

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Section: Resultssupporting

confidence: 52%

Thickness dependence of magnetic properties in La–Co substituted strontium hexaferrite films with perpendicular anisotropy

Hui

Cheng

Yan

et al. 2015

Journal of Magnetism and Magnetic Materials

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“…The surface morphology is one of the key features controlling mechanical and optical characteristics of the thin film. For example, the demagnetizing fields of thin magnetic films change as the interface roughness changes [4,5], and the electrical conductivity of thin metal films depends on surface roughness [6]. However, the surface height of a thin film is a random walk with respect to the position vector which makes it so hard to describe the surface morphology precisely by using a mathematical function.…”

Section: Introductionmentioning

confidence: 99%

Morphological Character and Statistical Property of Random Surface of ZnO Thin Film Prepared by RF Magnetron Sputtering

Zhang

Huo

et al. 2010

MSF

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A method for characterizing the morphology property of ZnO film surface with Gaussian correlation is investigated. The parameters of root-mean-square roughness w and lateral correlation lengthξare introduced in Gaussian model to describe the correlation properties of the random film surfaces. In the experimental performance, ZnO thin films are grown on quartz glass and silicon substrates by the reactive radio-frequency magnetron sputtering method under different deposition pressure. The surface morphologies of the film surface are scanned by an atomic force microscopy. The height auto-correlation functions and root-mean-square roughness are obtained by using the numerical calculus method. Carried on the fitting with the Gaussian function to the height auto-correlation function data, the lateral correlation lengths are extracted to describe the statistical properties of ZnO thin film in mathematics with other parameters.

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Effect of microstructural evolution on magnetic properties of Ni thin films

2009

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The magnetic properties of Ni thin films, in the range 20-500 nm, at the crystalline-nanocrystalline interface are reported. The effect of thickness, substrate and substrate temperature has been studied. For the films deposited at ambient temperatures on borosilicate glass substrates, the crystallite size, coercive field and magnetization energy density first increase and achieve a maximum at a critical value of thickness and decrease thereafter. At a thickness of 50 nm, the films deposited at ambient temperature onto borosilicate glass, MgO and silicon do not exhibit long-range order but are magnetic as is evident from the non-zero coercive field and magnetization energy. Phase contrast microscopy revealed that the grain sizes increase from a value of 30-50 nm at ambient temperature to 120-150 nm at 503 K and remain approximately constant in this range up to 593 K. The existence of grain boundary walls of width 30-50 nm is demonstrated using phase contrast images. The grain boundary area also stagnates at higher substrate temperature. There is pronounced shape anisotropy as evidenced by the increased aspect ratio of the grains as a function of substrate temperature. Nickel thin films of 50 nm show the absence of long-range crystalline order at ambient temperature growth conditions and a preferred [111] orientation at higher substrate temperatures. Thin films are found to be thermally relaxed at elevated deposition temperature and having large compressive strain at ambient temperature. This transition from nanocrystalline to crystalline order causes a peak in the coercive field in the region of transition as a function of thickness and substrate temperature. The saturation magnetization on the other hand increases with increase in substrate temperature.

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Effects of Surface Topography on Magnetization Reversal of Magnetic Thin Films

Cited by 5 publications

References 12 publications

Thickness dependence of magnetic properties in La–Co substituted strontium hexaferrite films with perpendicular anisotropy

Thickness dependence of magnetic properties in La–Co substituted strontium hexaferrite films with perpendicular anisotropy

Morphological Character and Statistical Property of Random Surface of ZnO Thin Film Prepared by RF Magnetron Sputtering

Effect of microstructural evolution on magnetic properties of Ni thin films

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