Bulk single-crystal potassium dihydrogen phosphate (KDP) is a nonlinear optical material mainly used in Inertial Confinement Fusion (ICF) facility. Since bulk single-crystal KDP is fragile, various defects usually appear in the surface layer, for example, laser-induced, cutting-induced, polishing-induced and dissolution-induced defects. In present work, the x-ray grazing incidence diffraction technique (GIXRD) is introduced to investigate the structure of these defects. The GIXRD method is proved to be a nondestructive and effective way for bulk single-crystal KDP defect characterization. Based on this method, it is found that the cutting-induced defect is a polycrystalline KDP layer, while the polishing-induced defect is a heterostructure layer. Meanwhile, the dissolution-induced defect, after atmosphere dissolution and accelerate dissolution, is an amorphous layer and a KDP recrystallized layer, respectively. In addition, the depth of these defect layers can be evaluated by the GIXRD methods.