2009
DOI: 10.1143/jjap.48.081608
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Effects of Thermal Annealing on ZnO Thin-Film Transistor Characteristics and the Application of Excimer Laser Annealing in Plastic-Based ZnO Thin-Film Transistors

Abstract: In this paper, we present the effects of thermal annealing and excimer laser annealing (ELA) on the characteristics of zinc-oxide (ZnO) thinfilm transistors (TFTs) fabricated by magnetron sputtering at room temperature. The transfer characteristics of the ZnO-TFTs are found to improve with increasing thermal annealing temperature. Results of in situ high-temperature X-ray diffraction and electron back scattered diffraction pattern analyses indicate that this phenomenon arises from the crystallization of a low-… Show more

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Cited by 16 publications
(14 citation statements)
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“…One may recognize the distinguishing features between the large-grain microcrystalline IGO and small-grain nanocrystalline ZnO for TFT characteristics if these films are used as an active channel layer in the TFT. [14][15][16] A large number of traps exist at the grain boundaries in the nanocrystalline ZnO film. The grain boundary scattering is possibly the dominant mechanism limiting the mobility of ZnO.…”
mentioning
confidence: 99%
“…One may recognize the distinguishing features between the large-grain microcrystalline IGO and small-grain nanocrystalline ZnO for TFT characteristics if these films are used as an active channel layer in the TFT. [14][15][16] A large number of traps exist at the grain boundaries in the nanocrystalline ZnO film. The grain boundary scattering is possibly the dominant mechanism limiting the mobility of ZnO.…”
mentioning
confidence: 99%
“…The responsivity of the NB nanoline was superior to the TA and NR nanolines. This result is noteworthy because both the electrical conductivity and responsivity of the ZnO nanoline were enhanced in the NB nanoline by the interior-architecturing, without the use of a high-temperature process of over 500°C [ 27 ]. We believe that fewer voids and interfacical trap states in the NBs nanoline led to an increase in the number of electron-hole pairs generated during UV illumination, to a greater extent than in the TA nanoline.…”
Section: Resultsmentioning
confidence: 99%
“…In particular, doped ZnO and undoped ZnO have long been studied as substitutes for ITO, and related research is still underway. However, few studies have been performed on the laser processing of solution-processed NP-based ZnO thin films, whereas studies on the laser annealing of ZnO thin films deposited through sputtering, evaporation, sol-gel processes, and pulsed laser deposition [34][35][36][37][38][39][40][41] have been actively reported. The researches presented below deal with ZnO thin films deposited using ZnO NPs but the final washing process illustrated in Fig.…”
Section: Znomentioning
confidence: 99%