Effects of water vapor on refractive index profiles in Ti:LiNbO<sub>3</sub>planar waveguides

Canali, C.; Bernardi, C. De; Sario, M. De; Loffredo, A; Mazzi, G.; Morasca, S.

doi:10.1109/jlt.1986.1074820

Cited by 18 publications

(8 citation statements)

References 6 publications

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“…We notice that the primary guide, which has the following construction parameters-index change at the surface An = 0.022, indepth characteristic length d, = 5.4 pm and width W = 2.5 pm-is shared by both filters. Of course the in-depth diffusion length db is the same for all guides because it .depends on the temperature and the diffusion time, while appropriate empirical curves [4] give the Ti stripe thickness to be deposited in order to obtain the desired An. Moreover, we can see that the curves are not straight lines, so the filter response will be slightly asymmetric.…”

Section: Numerical Resultsmentioning

confidence: 99%

Realistic design of a WDM duplexer made from Ti:LiNbO₃optical filters

Sario¹,

D’Orazio²,

Lanave³

1988

J. Phys. D: Appl. Phys.

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Section: Numerical Resultsmentioning

confidence: 99%

Realistic design of a WDM duplexer made from Ti:LiNbO₃optical filters

Sario¹,

D’Orazio²,

Lanave³

1988

J. Phys. D: Appl. Phys.

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“…This allows to measure the magnification obtained by the tilted polishing process. 8b [6]. 5 the angle is 2°48', i.e.…”

Section: Sample Preparationmentioning

confidence: 99%

A New Optical Scanning Microscope for Refractive Index Profiles Measurement

Loffredo¹

1988

Journal of Optical Communications

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We have investigated a new approach to the use of optical scanning microscopy for the measurement of refractive index profiles in optical waveguides. Besides the novelty in performing the scan of the optical beam, instead ofthat of the sample, a new technique is used for collecting the reflected beam. It consists in deviating the reflected beam just after the reflection takes place, so that no spurious reflections overlap in the detection branch, giving rise to unwanted background and noise. The feasibility of this approach for cleaved optical fibers is demonstrated, while in the case of polished planar optical waveguides, the polishing creates surface problems that affect the index profile.

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“…In order to have all the data useful to practical applications, several series of titanium in-diffused lithium niobate waveguides were fabricated at temperatures T ranging from 950 to 1050°C and at processing times t ra9ging from 1 to 30 h with deposited titanium thickness T ranging from 170 to 500 A. Figure 1 sketches the cross section of the designed [7]. The experimental setup uses a HeNe laser operating at 633 nm and a diode laser at 1319 nm focused on a rutile launching prism mounted on two goniometers perpendicular to each other in order to measure both the synchronous coupling angle 19, and the tilt angle &, [8].…”

Section: Single Optical Waveguide Layoutmentioning

confidence: 99%