2019
DOI: 10.1016/j.cap.2019.03.006
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Efficiency characteristics of a silicon oxide passivation layer on p-type crystalline silicon solar cell at low illumination

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Cited by 13 publications
(5 citation statements)
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“…TOPCon solar cells utilize an extremely thin SiO 2 film and poly-Si at the rear of the device to implement excellent passivation and achieve low contact resistance. The absorption of poly-Si, the use of inflammable, explosive, and toxic gases, and complicated process steps have inhibited the development of TOPCon solar cells. ,, …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…TOPCon solar cells utilize an extremely thin SiO 2 film and poly-Si at the rear of the device to implement excellent passivation and achieve low contact resistance. The absorption of poly-Si, the use of inflammable, explosive, and toxic gases, and complicated process steps have inhibited the development of TOPCon solar cells. ,, …”
Section: Introductionmentioning
confidence: 99%
“…The absorption of poly-Si, the use of inflammable, explosive, and toxic gases, and complicated process steps have inhibited the development of TOPCon solar cells. 13,19,20 A simple approach is to insert dopant-free carrier-selective contact materials between the c-Si base and the metal electrode to realize the carrier selectivity. The development of alternative electron-and hole-selective contact materials has the potential to avoid parasitic absorption and recombination and to synchronously decrease the cost and simplify the manufacturing process of silicon solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…SiO2 has a high fixed charge density and effectively eliminates the dangling surface bond. Because it is readily adaptable to the semiconductor process and is well known for its processing and thin-film characteristics, SiO2 is also frequently employed as a surface passivation layer for solar cells (Lee et al 2019).…”
Section: Materials Choicementioning
confidence: 99%
“…However, a small current density of the quantum efficiency measurement is able to pass the barrier [56]. Another possible reason for the above mentioned discrepancies, which may stem from obvious differences between local EQE as opposed to I-V measurements of the whole device, is the edge shunt phenomenon as it may be responsible for the majority of the total loss mechanism in the PV device [57]. The impact of other factors, such as a limited spectrum that was examined (300-950 nm) and differences in the spectrum resolution step (5 nm used for EQE measurement as opposed to 0.5-1 nm utilized for the AM1.5 Global spectrum data) should be negligible.…”
Section: Current-voltage Characteristicsmentioning
confidence: 99%