“…High‐resolution transmission electron microscopy is, maybe, the most popular scientific tool for thin carbon layer morphology control, but its usage is complicated for relatively large particles (few hundred nanometers and more) with thin carbon layers (few nanometers and less). Moreover, high‐resolution transmission electron microscopy can hardly provide proper statistical analysis (see discussion, for example, in Pelegov, Koshkina, Pryakhina, and Gorshkov), and it is inconvenient and too expensive for industrial in‐line quality control. X‐ray photoelectron spectroscopy (XPS) combines nanoscale in‐depth probing with averaging over a number of particles, but XPS also needs a high vacuum chamber, which is not typical for electrode material mass‐production lines thus resulting in additional complicated system of sampling and manipulation.…”