Abstract:Since its unique advantages in the trade-off between data acquisition rate and hardware cost, the scanning 1D multipleinput-multiple-output (MIMO) array setup has been widely used in nondestructive testing (NDT) applications, especially for product quality control on the assembly line. In this article, two fast fully focused algorithms based on scanning 1D MIMO array are developed for imaging half-space medium structures. Both of the algorithms are derived under the half-space Green's function, and are impleme… Show more
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