2022
DOI: 10.1002/adma.202205268
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Efficient and Stable Perovskite Solar Cells with a High Open‐Circuit Voltage Over 1.2 V Achieved by a Dual‐Side Passivation Layer

Abstract: Suppressing nonradiative recombination at the interface between the organometal halide perovskite (PVK) and the charge‐transport layer (CTL) is crucial for improving the efficiency and stability of PVK‐based solar cells (PSCs). Here, a new bathocuproine (BCP)‐based nonconjugated polyelectrolyte (poly‐BCP) is synthesized and this is introduced as a “dual‐side passivation layer” between the tin oxide (SnO2) CTL and the PVK absorber. Poly‐BCP significantly suppresses both bulk and interfacial nonradiative recombi… Show more

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Cited by 32 publications
(23 citation statements)
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“…To quantitatively study the effect of TDA modification on the defect state density of devices, the trap-state density (N trap ) of the devices is estimated with electron-only devices by the space-charge limited current method (SCLC) (Figure 5i). [55] The N trap is calculated from the trap-filled limit voltage (V TFL ) in Figure 5i, corresponding to 8.09 × 10 15 and 4.45 × 10 15 cm −3 for control and target devices, respectively. Obviously, the defect state density is successfully reduced after TDA modification.…”
Section: Resultsmentioning
confidence: 99%
“…To quantitatively study the effect of TDA modification on the defect state density of devices, the trap-state density (N trap ) of the devices is estimated with electron-only devices by the space-charge limited current method (SCLC) (Figure 5i). [55] The N trap is calculated from the trap-filled limit voltage (V TFL ) in Figure 5i, corresponding to 8.09 × 10 15 and 4.45 × 10 15 cm −3 for control and target devices, respectively. Obviously, the defect state density is successfully reduced after TDA modification.…”
Section: Resultsmentioning
confidence: 99%
“…For SnO 2 ETL, the defects mainly come from the oxygen vacancies (V O ) and interstitial tin atoms (Sn i ), [10,11] which can lead to charge carriers accumulation and nonradiative recombination loss at interface. A large number of bulk additives or surface modifiers, such as metal cations, [12][13][14][15] inorganic salts, [16][17][18][19] organic salts, [20][21][22][23][24][25] organic small molecules, [26][27][28][29][30][31] and polymers [32][33][34][35] have been developed to reduce V O and Sn i defects in SnO 2 ETL. Among them, the organic ammonium chloride matrix, in which chloride can dope V O and the N atom can bind with Sn i via Lewis acid-base interaction, has been developed as one of the most effective compounds to reduce the defects in SnO 2 ETL.…”
Section: Doi: 101002/adma202211545mentioning
confidence: 99%
“…The intensity of the diffraction peak (001) and the (002) plane increased significantly for the target films, which indicates better perovskite grain growth. 47 There was no 2D perovskite peak observed from the target thin films, which indicates that DPAC is located at the outer layer of the perovskite thin film. We infer that DPAC is adsorbed at the perovskite surface.…”
Section: Resultsmentioning
confidence: 94%