10th IEEE Pacific Rim International Symposium on Dependable Computing, 2004. Proceedings.
DOI: 10.1109/prdc.2004.1276582
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Efficient built-in self-test techniques for memory-based FFT processors

Shyue-Kung Lu
1
,
Chien‐Hung Yeh
2
,
Han-Wen Lin
3
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