2022
DOI: 10.1002/pssa.202200674
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Efficient Carrier Confinement in AlGaN‐Based Deep‐Ultraviolet Light‐Emitting Diodes with a Composition‐Graded Electron‐Blocking Layer

Abstract: The serious electron leakage and poor transport of hole injection layers in deep‐ultraviolet (DUV) light‐emitting diodes (LEDs) lead to an imbalance between the hole and electron currents, which reduces the device's performance. Herein, a new DUV LED structure is designed. The aluminum composition of the p‐type electron‐blocking layer (p‐EBL) gradually decreases from 0.95 to 0.75 along the growth direction, replacing the traditional bulk p‐EBL. When the injection current is 100 mA, the optical power of this st… Show more

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Cited by 4 publications
(2 citation statements)
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“…The step-fading p-AlGaN EBLs are similar to the linear-fading p-AlGaN EBLs in that they also have the effect of improving hole injection and suppressing electron leakage. Ye et al [73] step-fading decreased the Al component of p-AlGaN EBLs along the growth direction as shown in Figure 19. The optical power of AlGaN-based DUV-LEDs was increased by about 32% at 100 mA current.…”
Section: Design Of High-efficiency Algan-based Duv-leds Structures a ...mentioning
confidence: 86%
“…The step-fading p-AlGaN EBLs are similar to the linear-fading p-AlGaN EBLs in that they also have the effect of improving hole injection and suppressing electron leakage. Ye et al [73] step-fading decreased the Al component of p-AlGaN EBLs along the growth direction as shown in Figure 19. The optical power of AlGaN-based DUV-LEDs was increased by about 32% at 100 mA current.…”
Section: Design Of High-efficiency Algan-based Duv-leds Structures a ...mentioning
confidence: 86%
“…6,7 The design and manufacture of devices requiring lower wavelengths of operation for UV sources need Al-rich AlGaN layers. 8,9 Unfortunately, achieving highly crystalline elements with effective doping presents a number of difficulties for Al-rich AlGaN layers. 10 Degraded crystalline state is frequently perceived during the accumulation of Al-rich layers, which can be attributed to the foreign substrate's mismatch in lattice.…”
mentioning
confidence: 99%