Abstract:Efficient prediction of embedded element patterns (EEPs) is including the mutual coupling (MC) effects in the optimization of irregular planar arrays is studied for the first time in the literature. An ANN-based methodology is used to predict the pattern of each element in the whole visible space for a flexible planar array topology in milliseconds. The technique is proposed is validated on a 4-element planar non-uniform subarray structure. Excellent accuracy on the EEP prediction while providing great efficie… Show more
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