2017 International Conference on Advances in Computing, Communications and Informatics (ICACCI) 2017
DOI: 10.1109/icacci.2017.8126028
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Efficient test scheduling for reusable BIST in 3D stacked ICs

Navya Mohan
1
,
M. Soumya Krishnan
2
,
Sudhir Kumar Rai
3
et al.
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Cited by 2 publications
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Low Transition Dual LFSR for Low Power Testing

Mohan
1
,
Kumar
2
,
Dhanush
3
et al. 2020
Lecture Notes in Networks and Systems
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Low Transition Dual LFSR for Low Power Testing

Mohan
1
,
Kumar
2
,
Dhanush
3
et al. 2020
Lecture Notes in Networks and Systems
6
0
0
0
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Memory Grouping for the Built-In Self-Test of Three-Dimensional Integrated Circuits

Huang,
Huang
2024
Electronics
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